Inferring Latent Market Forces: Evaluating LLM Detection of Gamma Exposure Patterns via Obfuscation Testing
推断潜在市场力量:通过混淆测试评估大语言模型检测伽马暴露模式的能力
Christopher Regan, Ying Xie
机构
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Department of Computer Science Kennesaw State University Marietta, GA, Cobb(计算机科学系 凯尼恩州立大学 马里埃塔, 乔治亚州, 理查兹)
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Department of Information Technology Professor of Information Technology Kennesaw State University Marietta, GA(信息科技系 信息科技教授 凯尼恩州立大学 马里埃塔, 乔治亚州)
Comments10 pages, 8 figures. Accepted at IEEE Big Data 2025. Extended journal version in preparation. ISBN: 979-8-3315-9447-3/25. Page numbers: 7226-7235
Journal ref2025 IEEE International Conference on Big Data (Big Data)