SiMiC: Context-Aware Silicon Microstructure Characterization Using Attention-Based Convolutional Neural Networks for Field-Emission Tip Analysis
SiMiC:基于注意力卷积神经网络的硅微结构上下文感知表征用于场发射尖端分析
机构 * Department of Mechatronics and Biomedical Engineering, Lee Kong Chian Faculty of Engineering and Science, Universiti Tunku Abdul Rahman, Malaysia(机电与生物医学工程系,Lee Kong Chian工程与科学学院,塔努克阿卜杜勒拉曼大学,马来西亚) ; KETEK GmbH, Munich, Germany(KETEK公司,慕尼黑,德国)
专题命中 代码评测 :repository(abstract);分类 cs.AI
AI总结 SiMiC利用注意力卷积神经网络对场发射尖端的硅微结构进行上下文感知表征,提升微结构分析的精度与可解释性。
Journal ref Journal of Vacuum Science and Technology B (2025)