A Confidence-Diversity Framework for Calibrating AI Judgement in Accessible Qualitative Coding Tasks
Zhilong Zhao, Yindi Liu
机构
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School of Journalism and Communication, South China University of Technology, Guangzhou, China(新闻与传播学院,华南理工大学,广州,中国)
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Guangdong–Hong Kong–Macao Greater Bay Area Research Institute of International Communication, South China University of Technology, Guangzhou, China(粤港澳大湾区国际传播研究院,华南理工大学,广州,中国)
Michael Deistler, Jan Boelts, Peter Steinbach, Guy Moss, Thomas Moreau, Manuel Gloeckler, Pedro L. C. Rodrigues, Julia Linhart, Janne K. Lappalainen, Benjamin Kurt Miller, Pedro J. Gonçalves, Jan-Matthis Lueckmann, Cornelius Schröder, Jakob H. Macke
机构
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Machine Learning in Science, University of Tübingen(机器学习科学系,图宾根大学)
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Tübingen AI Center(图宾根人工智能中心)
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TransferLab, appliedAI Institute for Europe(TransferLab,应用AI欧洲研究所)
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Helmholtz AI and Helmholtz-Zentrum Dresden-Rossendorf(海德堡人工智能与德累斯顿-罗斯托克研究中心)
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Université Paris-Saclay, Inria, CEA, Palaiseau, 91120, France(巴黎-萨克雷大学,法国国家信息与自动化研究所,法国原子能委员会,帕莱伊索,91120)
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Univ. Grenoble Alpes, Inria, CNRS, Grenoble INP, LJK(格勒诺布尔阿尔卑斯大学,法国国家信息与自动化研究所,国家科学研究中心,格勒诺布尔INP,LJK)
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University of Amsterdam(阿姆斯特丹大学)
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VIB-Neuroelectronics Research Flanders (NERF), Belgium(比利时弗拉芒神经电子研究VIB-NERF)
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Departments of Computer Science and Electrical Engineering, KU Leuven, Belgium(比利时鲁文大学计算机科学与电气工程系)
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Google Research(谷歌研究)
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Department Empirical Inference, Max Planck Institute for Intelligent Systems, Tübingen, Germany(经验推理部门,马克斯·普朗克智能系统研究所,图宾根,德国)
Machine Learning-Based Manufacturing Cost Prediction from 2D Engineering Drawings via Geometric Features
Ahmet Bilal Arıkan, Şener Özönder, Mustafa Taha Koçyiğit, Hüseyin Oktay Altun, H. Kübra Küçükkartal, Murat Arslanoğlu, Fatih Çağırankaya, Berk Ayvaz
机构
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Institute for Data Science \& Artificial Intelligence, Bo g azi c i University, \. I stanbul, T\" u rkiye
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ArtificaX Technologies, Bo g azi c i Teknopark, \. I stanbul, T\" u rkiye
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Teknorot Automative Products Inc., D\" u zce, T\" u rkiye
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\. I stanbul Ticaret University, Faculty of Engineering, Industrial Engineering, \. I stanbul, T\" u rkiye
Operando Electron Microscopy of Nanoscale Electronic Devices on Non-Conductive Substrates
Menglin Zhu, Michael Xu, Zishen Tian, Colin Gilgenbach, Daniel Drury, Bridget R. Denzer, Ching-Che Lin, Deokyoung Kang, Lane W. Martin, James M. LeBeau
EFECT: A Method to Quantify the Reproducibility of Stochastic Simulations
T. J. Sego, Matthias König, Luis L. Fonseca, Dilan Pathirana, Frank T. Bergmann, Hernán E. Grecco, Mauro Silberberg, Subhasis Ray, Baylor Fain, Adam C. Knapp, Krishna Tiwari, Henning Hermjakob, Herbert M. Sauro, James A. Glazier, Reinhard C. Laubenbacher, Rahuman S. Malik-Sheriff
Rethinking Autonomy: Preventing Failures in AI-Driven Software Engineering
Satyam Kumar Navneet, Joydeep Chandra
机构
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Department of CSE Chandigarh University Mohali, India(计算机科学与工程系 奇纳格里大学 莫哈利,印度)
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Department of CST Tsinghua University Beijing, China(计算机科学与技术系 清华大学 北京,中国)
Journal refProceedings of the 38th International Conference on Neural Information Processing Systems (NIPS '24), Vol. 37 (2024), Article 3551, 111832-111862