双等离子体激发团簇电离
Cluster ionization via two-plasmon excitation
摘要：
我们计算了表面等离子体共振附近光子能量的团簇双光子电离。结果表示在双等离子体激元激发，这是微扰计算的电离率。对于Schlipper等人的实验条件，我们发现电离率的数量级为0.05-0.10 fs^（-1）。该速率用于确定在外场中根据吸收的光子数和场的持续时间的电离概率。该概率还取决于表面等离子体激元的阻尼率。只有当等离激元阻尼比室温单光子吸收谱中观察到的宽度小得多时，才能与实验相符。
英文摘要：
We calculate the two-photon ionization of clusters for photon energies near the surface plasmon resonance. The results are expressed in terms of the ionization rate of a double plasmon excitation, which is calculated perturbatively. For the conditions of the experiment by Schlipper et al., we find an ionization rate of the order of 0.05-0.10 fs^(-1). This rate is used to determine the ionization probability in an external field in terms of the number of photons absorbed and the duration of the field. The probability also depends on the damping rate of the surface plasmon. Agreement with experiment can only be achieved if the plasmon damping is considerably smaller than its observed width in the room-temperature single-photon absorption spectrum.
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