利用聚焦Laser光束的Gouy相位干涉测量单个纳米颗粒
Interferometry of a Single Nanoparticle Using the Gouy Phase of a Focused Laser Beam
摘要：
我们提供了一个定量的解释机制的远场强度调制引起的纳米粒子在一个聚焦的高斯激光束，在最近的几个直接检测的研究表明。大多数方法利用入射光和来自纳米颗粒的散射光之间的干涉来促进信号对纳米颗粒体积的线性依赖性。利用古伊相位的概念，阐明了入射场与纳米粒子散射场之间的相位关系。该相位关系用于分析作为相对于光束焦点的精确纳米颗粒位置的函数的远场信噪比。计算表明，一个纯粹的色散纳米粒子应该从高斯光束焦点位移，以产生远场强度变化。
英文摘要：
We provide a quantitative explanation of the mechanism of the far-field intensity modulation induced by a nanoparticle in a focused Gaussian laser beam, as was demonstrated in several recent direct detection studies. Most approaches take advantage of interference between the incident light and the scattered light from a nanoparticle to facilitate a linear dependence of the signal on the nanoparticle volume. The phase relation between the incoming field and the scattered field by the nanoparticle is elucidated by the concept of Gouy phase. This phase relation is used to analyze the far-field signal-to-noise ratio as a function of exact nanoparticle position with respect to the beam focus. The calculation suggests that a purely dispersive nanoparticle should be displaced from the Gaussian beam focus to generate a far-field intensity change.
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