用laser光剥离信号测量电子鞘层厚度和电探针收集区
Measurement of electron sheath thickness and collection region of electric probe using laser photodetachment signals
摘要：
提出了一种新型的激光光剥离（LPD）技术，用于测量静电探针周围的电子鞘层厚度和光剥离电子（PDE）收集区长度。当围绕静电探针形成的鞘的厚度比约0.1mm厚时，观察到LPD信号的时间演变的修改。利用该修正方法，对15 mT的磁场作用下圆柱形探头周围的鞘层厚度进行了计算。结果发现，沿磁场的电子鞘层的厚度与计算的平面平行的Child-Langmuir鞘层的厚度时，探针偏置电压是高的。此外，通过在激光束通道中插入一个小的屏蔽物体，我们可以通过修改LPD信号来测量鞘层厚度。从垂直于激光束通道扫描屏蔽物时信号强度的变化，我们可以观察到光分离电子的收集区，因为这一过程改变了阴影与探针电极之间的相对位移。
英文摘要：
A new type of laser photodetachment (LPD) technique has been developed for the measurement of electron sheath thickness around an electrostatic probe and for the measurement of the length of collection region of photodetached electrons (PDE). When a thickness of the sheath formed around an electrostatic probe is thicker than about 0.1 mm, modification of the temporal evolution of the LPD signal is observed. By making use of the modification, we evaluated sheath thickness around a cylindrical probe in the existence of the magnetic field of 15 mT. It was found that the thickness of electron sheath along the magnetic field was comparable to the calculated plane-parallel Child-Langmuir sheath thickness when the probe-bias voltage was high. Furthermore, by inserting a small screening object in the laser beam channel, we can measure the sheath thickness from the modification of LPD signal. From the variation of the signal intensity as scanning the screening object perpendicular to the laser beam channel, we can observe the collection region of photodetached electrons, because this procedure changes the relative displacement between shadow and the probe electrode.
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