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arXiv physics/0008024physics.acc-ph
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用X射线谱测量RF腔电压

Measurements of RF Cavity Voltages by X-ray Spectrum Measurements

J. P. Duke, A. P. Letchford, D. J. S. Findlay

摘要:

射频腔体发射的X射线谱端点的测量是一种有用的非侵入性技术,用于测量腔内的峰值电压。描述了计算的X射线谱与测量谱的匹配,重点是端点区域。

英文摘要:

Measurement of the endpoints of X-ray spectra emitted from RF cavities is a useful non-invasive technique for measuring peak voltages within the cavities. The matching of calculated X-ray spectra to measured spectra is described, with emphasis upon the endpoint region.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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