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arXiv cond-mat/9908099cond-mat.mes-hall
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无序导体中的低温退相:实验方面

Low-temperature dephasing in disordered conductors: experimental aspects

Michael Gershenson

摘要:

在低维导体中,人们可以追踪退相时间增长的最低温度是多少?我认为的基本限制,交叉从弱到强本地化,以及经常观察到的失相时间(热电子效应,外部噪声失相)饱和的几个实验原因。本文还简要地讨论了无序导体中电子-声子相互作用的最新进展。

英文摘要:

What is the lowest temperature to which one can trace the growth of the dephasing time in low-dimensional conductors? I consider the fundamental limitation, the crossover from weak to strong localization, as well as several experimental reasons for frequently observed saturation of the dephasing time (hot-electron effects, dephasing by external noise). Recent progress in our understanding of the electron-phonon interaction in disordered conductors is also briefly discussed.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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