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显式仿射见证隔离的近逆线性障碍

Near-Inverse-Linear Barriers for Explicit Affine Witness Isolation

Sebastian Ben Daniel

arXiv 2610.11432首次发表:更新:

AI 中文总结

该研究针对显式仿射见证隔离,通过随机变换的成功保证推导NP⊆P/poly等复杂度坍缩结论,明确了仿射分量数量与成功保证的关联条件。

AI 中文摘要

我们研究随机非均匀多项式规模变换,该变换针对非空满足集为仿射的电路输入输出显式二元仿射滤波器,滤波器可依赖整个输入描述,无需提供仿射基。对每个固定的δ<1,最坏情况单元素成功保证Ω(n^(-δ))(n为见证元数)意味着NP⊆P/poly。更一般地,任何成功保证ω(log n/n),对长度为s、含至多v个见证变量的描述,可得到规模为(s+2)^(O(1))2^(o(v))的可满足性电路,当s=v^(O(1))时对v呈亚指数级。反之,SAT搜索到决策给出确定性完美隔离,使多项式资源固定指数强仿射隔离等价于NP⊆P/poly。对至多n^β个仿射分量的显式并集,当β,δ≥0且β+δ<1时,成功Ω(n^(-δ))意味着相同坍缩,未声明逆线性端点。

英文摘要

We study randomized nonuniform polynomial-size transformations that output explicit binary affine filters for circuit inputs whose nonempty satisfying sets are affine. The filter may depend on the entire input description; no affine basis is supplied. For every fixed $δ<1$, a worst-case singleton success guarantee $Ω(n^{-δ})$, where $n$ is the witness arity, implies $NP\subseteq P/poly$. More generally, any success guarantee $ω(\log n/n)$ yields satisfiability circuits of size $(s+2)^{O(1)}2^{o(v)}$ for length-$s$ descriptions with at most $v$ witness variables, hence subexponential in $v$ when $s=v^{O(1)}$. Conversely, SAT search-to-decision gives deterministic perfect isolation, making polynomial-resource fixed-exponent strong affine isolation equivalent to $NP\subseteq P/poly$. For explicit unions of at most $n^β$ affine components, success $Ω(n^{-δ})$ implies the same collapse whenever $β,δ\ge0$ and $β+δ<1$. The inverse-linear endpoint is not claimed.

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