发表机构
University of Washington（华盛顿大学）
机构由 AI 辅助整理，请以论文原文为准。AI 中文总结
本研究利用多波长激发光致发光无损区分钙钛矿太阳能电池中界面与体相复合损失，发现PEABF4处理钝化ETL界面但加速热老化降解，为老化研究提供深度敏感分析框架。
AI 中文摘要
实时研究钙钛矿半导体中的降解仍是一项重要挑战。传统方法往往无法区分界面过程与体相过程，或依赖于破坏性分析。在此，我们展示了多波长激发光致发光（PL）作为一种非破坏性方法，用于区分界面主导和体相主导的复合损失。以苯乙铵四氟硼酸盐（PEABF4）处理为模型，我们利用PL表明PEABF4钝化了电子传输层（ETL）/钙钛矿界面，减少了来自富勒烯沉积的界面复合损失。然而，在热老化后，PEABF4处理的堆叠结构降解更快，复合损失从ETL/钙钛矿界面扩展到吸收层内部。扩散-复合模拟支持对激发波长依赖的PL衰减特征的解释，这些特征与表面复合速度和体相寿命的变化一致，为老化过程中的深度敏感比较提供了框架。总体而言，这些结果进一步确立了多波长激发PL作为研究钙钛矿薄膜老化过程中复合损失的平台。
英文摘要
Studying real-time degradation in perovskite semiconductors remains an important challenge. Conventional methods often cannot separate interfacial and bulk processes or rely on destructive analysis. Here, we demonstrate multiwavelength excitation photoluminescence (PL) as a nondestructive approach to distinguish interface- and bulk-dominated recombination losses. Using phenethylammonium tetrafluoroborate (PEABF4) treatment as a model, we use PL to show that PEABF4 passivates the electron transport layer (ETL)/perovskite interface, reducing interfacial recombination losses from fullerene deposition. However, upon thermal aging, PEABF4-treated stacks degrade more rapidly, with recombination losses broadening from the ETL/perovskite interface into the absorber. Diffusion-recombination simulations support interpreting excitation-wavelength-dependent PL decay signatures consistent with changes in surface recombination velocity and bulk lifetime, providing a framework for depth-sensitive comparisons during aging. Collectively, these results further establish multiwavelength excitation PL as a platform for studying recombination losses during aging of perovskite films.
DOI：10.1021/acs.jpclett.6c01989
