发表机构
National Institute of Standards and Technology; Department of Physics, University of Colorado（美国国家标准与技术研究院; 科罗拉多大学物理系）
机构由 AI 辅助整理，请以论文原文为准。AI 中文总结
本文提出利用Autler-Townes分裂在电磁感应透明特征中实现频率轴校准，通过拟合两能级模型获得校准因子，与精细结构校准一致性达1.11%以内，且对功率偏差鲁棒。
AI 中文摘要
基于里德伯原子的电测量是一种关键技术，能够实现可溯源至国际单位制的射频（rf）场测量。这通常通过将经典探针的直接射频功率测量转换为频率测量来实现，该频率测量参照两个定义明确的光谱特征、商用波长计或通过时钟约束的电光调制器产生的窄腔线，尽管存在这些均不可用的情况。在本文中，我们证明了已知的射频频率标度可用于通过Autler-Townes（AT）分裂推断激光器的频率扫描。换言之，我们展示了可以利用近共振射频辐射的避交叉行为实现频率轴校准。测量了AT分裂特征之间的相对间隔作为所施加射频场的功率和相对于原子共振的失谐的函数。然后，利用加权非线性最小二乘回归分析将这些峰间隔拟合到一个简单的两能级模型，该分析使用三个拟合参数，其中之一是所需的校准因子。虽然我们没有将此方法对照绝对频率基准进行基准测试，但我们确实表明该方法（1）与通过已知精细结构分裂进行的校准在约1.11%或更好的范围内一致，并且（2）对系统已知射频功率依赖性的显著实验偏差具有鲁棒性。
英文摘要
Rydberg atom-based electrometry is a pivotal technology that enables radio-frequency (rf) field measurements traceable to the International System of Units. This is typically accomplished by converting the direct rf power measurement of classical probes to a frequency measurement referenced to two well-defined spectral features, a commercial wavemeter, or narrow cavity lines produced via clock disciplined electro-optic modulators, although there exist cases where none of these are available. In this article, we demonstrate that a known rf frequency scale can be used to infer a laser's frequency scan using Autler-Townes (AT) splitting. In other words, we show that frequency-axis calibration can be achieved using the avoided-crossing behavior of near-resonant rf radiation. The relative separation between AT-split features is measured as a function of an applied rf field's power and detuning from atomic resonance. These peak separations are then fit to a simple, two-level model using a weighted nonlinear least-squares regression analysis that utilizes three fitting parameters, one of which is the desired calibration factor. While we do not benchmark this method against an absolute frequency reference, we do show that this method is (1) consistent with calibration via known fine-structure separation to within approximately 1.11% or better, and (2) robust against substantial experimental deviation from the system's known rf power dependence.
Comments11 pages, 7 figures, 1 table
