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PEEK:安全关键处理器中特权错误检测的异构并行机制

PEEK: Heterogeneous Parallelism for Privileged Error Detection in Safety-Critical Processors

Tinglue Wang, Zhenghui Guo, Bing Guo, Jiapeng Guan, Renshuang Jiang, Jie Zhang, Jing Li, Xin Si, Sam Ainsworth, Zhe Jiang

arXiv 2610.03045首次发表:更新:

发表机构

Southeast University, China; National Center of Technology Innovation for EDA, China; National University of Defense Technology, China; New Jersey Institute of Technology, US; University of Edinburgh, UK(东南大学; EDA技术创新国家中心; 国防科技大学; 新泽理工学院; 爱丁堡大学)

机构由 AI 辅助整理,请以论文原文为准。

AI 中文总结

PEEK提出首个特权并行错误检测架构,通过重新设计验证流水线,在Linux上实现全特权保护,性能损失极小且硬件开销可接受,并已流片验证。

AI 中文摘要

异构并行错误检测架构已被广泛研究,用于保护安全关键系统中的乱序超标量处理器,因为它利用次级执行中存在的并行性,相比传统LockStep实现了显著更低的硬件开销。然而,以往的工作并未涵盖特权模式执行的保护,这阻碍了其在实际部署中的有效性。此外,对特权模式的简单扩展可能导致一系列问题,从因高同步开销导致的性能低下,到完全死锁。在此,我们提出PEEK,这是首个特权并行错误检测架构。基于对特权执行的深入分析,我们重新设计了验证流水线,解决了特权模式保护中识别出的所有瓶颈和错误。在使用运行Linux的RTL级全系统进行的多种指标评估中,PEEK在Linux上实现了全特权保护,且性能下降可忽略不计,硬件开销可接受。PEEK已采用28nm工艺流片,其源码可在以下网址获取:此https URL。

英文摘要

Heterogeneous parallel error detection architecture has been widely studied for safeguarding OoO superscalar processors in safetycritical systems, as it achieves significantly lower hardware overhead compared to traditional LockStep, by exploiting the parallelism that exists in a secondary execution. However, previous works do not cover the protection of privileged-mode execution, impeding their effectiveness in real-world deployment. Moreover, naive extension to privileged-mode can cause a litany of issues, from abysmal performance due to high synchronization costs, to full deadlocks. Here, we present PEEK, the first privileged parallel error detection architecture. Based on a deep analysis of privileged execution, we redesign the verification pipeline, addressing all the bottlenecks and bugs identified in privileged-mode protection. Evaluated using various metrics on an RTL-level full system running Linux, PEEK achieves full-privilege protection on Linux with negligible performance slowdown and affordable hardware overhead. PEEK has been taped out using a 28nm process, and its source is available at https://anonymous.4open.science/r/PEEK-3000.

CommentsThis paper has been accepted for publication at MICRO 2026. This arXiv submission is the pre-camera-ready version; the final camera-ready version will appear in the MICRO 2026 conference proceedings

论文原文

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