近最优并行幺正过程层析成像在金刚石距离下
Near-Optimal Parallel Unitary Process Tomography in Diamond Distance
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中文总结 AI 辅助
本文证明在金刚石距离下，通过新颖的并行程序可实现近最优查询复杂度的幺正过程层析成像，弥补了与顺序电路的差距。
中文摘要 AI 辅助
幺正过程层析成像是一种学习未知幺正门如何作用于量子系统的行为。它是实现功能性量子计算机的必要程序。随着量子技术的发展，理解使用各种类型电路进行幺正过程层析成像所需的计算资源非常重要。特别是，在金刚石距离下测量误差时，已知使用顺序电路架构可以实现最优查询复杂度，但尚不清楚并行电路架构是否能达到同样的最优查询复杂度。在这项工作中，我们通过引入一种明确的、新颖的并行程序，证明了使用并行电路确实可以实现近最优查询复杂度的幺正过程层析成像。这弥补了顺序电路和并行电路之间的差距，直到一个对数因子，表明并行和顺序策略在此任务上几乎同样有能力。
英文摘要
Unitary process tomography is the act of learning how an unknown unitary gate acts on a quantum system. It is an essential procedure for realizing a functioning quantum computer. As quantum technologies develop, it is important to understand the computational resources needed to conduct unitary process tomography using a variety of types of circuits. In particular, when measuring error in diamond distance, it is known how to achieve optimal query complexity using a sequential circuit architecture, but it had not been known whether a parallel circuit architecture could achieve the same optimal query complexity. In this work, we prove that unitary process tomography with near-optimal query complexity is indeed possible using a parallel circuit by introducing an explicit, novel parallel procedure. This closes the gap between sequential and parallel circuits up to a logarithmic factor, showing that parallel and sequential strategies are nearly equally capable for this task.
发表机构
- University of Waterloo（滑铁卢大学）
- Perimeter Institute for Theoretical Physics（理论物理前沿研究所）
机构由 AI 辅助整理，请以论文原文为准。
