温度和外加电场对光电倍增管暗计数率影响的建模

中文摘要 AI 辅助

尽管光电倍增管（PMT）对于基于单光子计数的应用具有足够的灵敏度，但来自光电阴极的热电子发射是主要的背景噪声来源之一。在本研究中，我们基于Richardson-Dushman方程并纳入肖特基效应，对给定PMT的暗计数率随温度和外加电场的变化进行了建模。为验证该模型，我们使用配备双碱光电阴极的八厘米滨松R14374 PMT进行了测量。暗计数率在10至40摄氏度的温度范围内进行了测量。通过改变光电阴极与周围介质之间的电位差从0到1100伏，将外加电场施加到带有光电阴极的光学窗口外表面。结果证实，在200伏的差值范围内，外部电位差的影响相对较小，在所有测量温度下暗计数率的增加保持在50%以下。通过引入误差函数，将该行为纳入所提出的模型中，以预测在不同温度和外部电场的工作条件下的暗计数率。

英文摘要

Although photomultiplier tubes (PMTs) are sufficiently sensitive for applications based on counting single photons, the thermionic emission of electrons from the photocathode is one of the dominant background sources. In this study, we modeled the dark count rate of a given PMT as a function of the temperature and external electric field based on the Richardson-Dushman equation and incorporated the Schottky effect. To validate the model, measurements were performed using an eight-centimeter Hamamatsu R14374 PMT equipped with a bialkali photocathode. The dark count rate was measured over a range of temperatures from 10 to 40 degree Celsius. An external electric field was applied to the outside surface of the optical window with the photocathode by varying the potential difference between the photocathode and the surrounding medium from 0 to 1100 V. The result confirmed that the influence of the external potential difference remained relatively small within a difference of 200 V, with the increase in the dark count rate remaining below 50 % across all measured temperatures. This behavior was incorporated into the proposed model by including an error function to predict the dark count rate under operating conditions with varying temperatures and external electric fields.

发表机构

• Graduate School of Science and Technology, Keio University（庆应义塾大学理工学部研究生院）

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