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Pendellösung长度尺度中子和X射线干涉测量

Pendellösung length-scale neutron and X-ray interferometry

Owen Lailey, Alexandre Boutot, David G. Cory, Joseph P. Cotter, Vishal Dhamgaye, Tao Hong, Michael G. Huber, Young-June Kim, Winfried Kockelmann, Jeremy W. Paster, Dusan Sarenac, Kawal Sawhney, Naume Shentevski, Ivar Taminiau, Dmitry A. Pushin

arXiv 2609.24709首次发表:更新:

发表机构

Institute for Quantum Computing, University of Waterloo; Department of Physics and Astronomy, University of Waterloo; Department of Chemistry, University of Waterloo; Centre for Cold Matter, Blackett Laboratory, Imperial College London; Diamond Light Source Ltd.; Neutron Scattering Division, Oak Ridge National Laboratory; National Institute of Standards and Technology; Physics Department, University of Toronto; STFC-Rutherford Appleton Laboratory, ISIS Facility; Department of Physics, University at Buffalo, State University of New York(滑铁卢大学量子计算研究所; 滑铁卢大学物理与天文学系; 滑铁卢大学化学系; 伦敦帝国理工学院布莱克特实验室冷物质中心; 钻石光源有限公司; 橡树岭国家实验室中子散射部; 美国国家标准与技术研究院; 多伦多大学物理系; STC-鲁瑟福阿普尔顿实验室ISIS设施; 纽约州立大学布法罗分校物理系)

机构由 AI 辅助整理,请以论文原文为准。

AI 中文总结

本研究利用非蚀刻亚微米技术制造出110微米和350微米等厚刀片的硅三拉乌干涉仪,实现中子和X射线操作,显著减少衍射模糊并达到pendellösung长度区域,为量子光学光束分裂及中子自旋轨道测量提供新平台。

AI 中文摘要

中子和X射线完美晶体干涉仪(PCIs)是基础物理研究和相衬成像的强大平台。进一步提升多项PCI能力需要将晶体刀片厚度减小到微米尺度,这能最小化动力学衍射图像模糊,允许在pendellösung区域工作,其中刀片厚度控制光束分裂,并减少同时进行中子和X射线操作时的吸收。然而,在厘米级面积上制造多个具有相同微米级厚度的晶体刀片仍是一个重大挑战。在此,我们利用一种非蚀刻亚微米制造技术,展示了具有110微米和350微米等厚刀片的硅三拉乌干涉仪,并同时使用中子和X射线操作。这些器件是迄今为止实现的最薄PCI,使得动力学衍射光束扩散减少六倍,从而改善相衬成像,同时达到单一pendellösung长度区域,在该区域中晶体厚度为工程化平面波输入的量子光学光束分裂提供了实验可调的控制参数。这些结果激励了利用相同半pendellösung晶体薄片的多刀片PCI设计,该设计被提议用于中子自旋轨道和电偶极矩测量。

英文摘要

Neutron and X-ray perfect-crystal interferometers (PCIs) are powerful platforms for studies of fundamental physics and phase-contrast imaging. Further enhancing several PCI capabilities requires reducing crystal blade thickness to the micron scale, which minimizes dynamical-diffraction image blur, permits operation in the pendellösung regime where blade thickness controls beam splitting, and reduces absorption for simultaneous neutron and X-ray operation. However, fabricating multiple crystal blades with identical micrometer-scale thicknesses over centimeter-scale areas remains a major challenge. Here, using a non-etching sub-micron fabrication technique, we demonstrate silicon triple-Laue interferometers with equal-blade-thicknesses of 110 $μ$m and 350 $μ$m, operated with both neutrons and X-rays. These devices are the thinnest PCIs realized to date, enabling a factor-of-six reduction in dynamical-diffraction beam spreading for improved phase-contrast imaging, while reaching the single pendellösung length regime in which crystal thickness provides an experimentally accessible control parameter for engineered quantum-optical beam splitting of plane-wave inputs. These results motivate multi-blade PCI designs utilizing identical half-pendellösung crystal lamellae that are proposed for neutron spin--orbit and electric dipole moment measurements.

论文原文

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