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可扩展的多电子输运架构用于反馈可溯源的电流源

Scalable Multiple Electron Transport Architectures for Feedback Traceable Current Sources

Agustin Javier Lapi, Guillermo Fernandez Moroni, Fernando Chierchie, Fabricio Alcalde Bessia, Miqueas Ezequiel Gamero, Brenda Aurea Cervantes Vergara, Blas Junior Irigoyen Gimenez, Eduardo Paolini, Claudio Rodrigo Chavez Blanco, Juan Estrada, Javier Tiffenberg

arXiv 2609.24015首次发表:更新:

发表机构

University of Chicago; Instituto de Inv. en Ing. Eléctrica “Alfredo Desages” (IIIE), CONICET and Universidad Nacional del Sur (UNS); Fermi National Accelerator Laboratory; DIEC - Universidad Nacional del Sur; Instituto Balseiro; Instituto de Nanociencia y Nanotecnología INN (CNEA-CONICET)(芝加哥大学; 阿尔弗雷多·德萨热斯电气工程学院研究所(IIIE),阿根廷国家科研委员会和国立南方大学; 费米国家加速器实验室; 国立南方大学 DIEC; 巴尔塞罗研究所; 纳米科学与纳米技术研究所(CNEA-CONICET))

机构由 AI 辅助整理,请以论文原文为准。

AI 中文总结

本文提出一种基于浮栅的MET器件,实现离散电荷包的可控注入与精确量化,通过并联/串联多放大器架构降低噪声,提供稳定可编程输出,用于电子计数电流源和量子计量。

AI 中文摘要

我们提出了一种基于浮栅架构的可扩展电子计数电流单元,该架构作为多电子输运(MET)器件运行。该系统利用传感器的非破坏性多次读出能力,实现了离散电荷包的可控注入、输运和精确量化。我们重新利用了电荷注入技术,并结合电子分辨能力,用于受控生成量子化的电荷包,以构建电子可溯源的电流源。我们探索了基于并联和串联多放大器配置的可扩展架构。实验结果证实,噪声随独立测量次数的平方根而降低,并展示了稳定、可编程的输出电流。该方法为电子计数电流源和精密量子计量应用提供了一个紧凑且可扩展的平台。

英文摘要

We present a scalable electron-counting current cell based on a floating gate architecture operated as a Multiple Electron Transport device (MET). The system enables controlled injection, transport, and precise quantification of discrete charge packets using the sensor non-destructive multiple readout capability. We repurposed the charge-injection technique, jointly with the electron-resolution capability, for a controlled generation of quantized charge packets for an electron-traceable current source. Scalable architectures based on parallel and series multi-amplifier configurations are explored. Experimental results confirm noise reduction following the square root of the number of independent measurements and demonstrate stable, programmable output current. This approach provides a compact and scalable platform for electron-counting current sources and precision quantum metrology applications.

Comments12 pages, 19 figures

论文原文

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