微波炉在维修前后高电平非电离辐射（NIR）测量的分析
Analysis of Measurements in a Microwave Oven with High Level of Non-Ionizing Radiation (NIR) Before and After Repair
- National Telecommunication Agency (ANATEL)（国家电信管理局（ANATEL））
- Federal University of Rio Grande do Norte（北里奥格兰德联邦大学）
机构由 AI 辅助整理，请以论文原文为准。
AI总结：
本文测量了高电平非电离辐射的微波炉在两种维修前后的辐射水平，基于FDA和INMETRO标准评估维修效率，以确保安全操作。
AI中文摘要：
非电离辐射是多种应用的主题，例如非常流行的微波炉。其使用特点是用户直接操作，且用户与NIR源之间的距离缩短。因此，在此场景中人体暴露水平值得关注，因为它可能是生物效应的潜在原因。在此意义上，本文提出了在两种建议维修前后对具有高电平NIR（超过标准规定的限值）的微波炉进行测量：使用环氧腻子（维修1）和更换烤箱外表面（维修2）。基于FDA和INMETRO标准的测量方法定义被提出并讨论。最后，我们描述了这些维修方法在安全操作方面效率的分析。
英文摘要：
Non-ionizing radiation is the subject of several applications, such as the microwave oven, which is very popular. Its use is characterized by direct user operation and reduced distances between users and the NIR source. Therefore, the level of human exposure in this scenario deserves attention as it is a potential cause of biological effects. In this sense, this paper presents the measurement of a microwave oven with a high level of NIR (above the limit defined by the standard) before and after two types of suggested repairs: the use of epoxy putty (Repair 1) and the replacement of the external surface of the oven (Repair 2). The definitions of measurement methodology, based on FDA and INMETRO standards, are presented and discussed. Finally, we describe an analysis of the efficiency of these repair methods aiming at the safety operation.
