基于计数的太阳耀斑X射线光谱分量成像（CCI）
Count-based spectral component imaging (CCI) of solar flares in X-rays
- Università di Genova（热那亚大学）
- University of Applied Sciences and Arts Northwestern Switzerland（瑞士西北应用科学艺术大学）
- ETH Zürich（苏黎世联邦理工学院）
- Istituto Nazionale di Astrofisica, Osservatorio Astrofisico di Torino（意大利国家天体物理研究所都灵天文台）
机构由 AI 辅助整理，请以论文原文为准。
AI总结：
本文提出基于计数的光谱分量成像（CCI）技术，联合重建太阳耀斑热与非热X射线分量的空间分布，经STIX数据验证与SCI结果一致且输入更少，并适用于硬X射线聚焦成像。
AI中文摘要：
太阳耀斑中的X射线发射由多热等离子体和加速电子共同产生。经典成像方法重建的X射线强度图包含多个光谱分量（如热、超热和非热）的贡献，无法分别提取不同分量的形态。我们提出一种新颖的成像技术，称为“基于计数的光谱分量成像（CCI）”，利用太阳轨道器上搭载的X射线成像光谱仪/望远镜（STIX）提供的数据，联合重建热分量的空间分辨发射测量图和非热分量的电子通量分布。我们构建了一个线性模型，将由两个热分量近似的微分发射测量（DEM）和非热电子通量与观测计数联系起来。所得逆问题采用Richardson-Lucy算法求解。我们将CCI应用于SOL2024-10-01T22的STIX观测，并与先前开发的光谱分量成像（SCI）方法以及经典成像方法进行比较。重建的热和非热分量与SCI获得的结果吻合良好。这项概念验证研究表明，CCI获得的结果与SCI一致，但所需输入更少。与SCI相比，CCI还可应用于硬X射线聚焦光学成像。
英文摘要：
X-ray emission in solar flares is produced by both multi-thermal plasma and accelerated electrons. Classical imaging approaches reconstruct X-ray intensity maps which contain contributions from multiple spectral components (e.g., hot, superhot, and non-thermal), and do not allow retrieving the morphology of the different components separately. We introduce a novel imaging technique, called "Count-based spectral Component Imaging (CCI)", to jointly reconstruct spatially resolved emission measure maps of the thermal components, and the electron flux distribution of the non-thermal component from data provided by the Spectrometer/Telescope for Imaging X-rays (STIX) aboard Solar Orbiter. We formulate a linear model linking the Differential Emission Measure (DEM), approximated by two thermal components, and the non-thermal electron flux to the observed counts. The resulting inverse problem is solved with the Richardson-Lucy algorithm. We apply CCI to STIX observations of SOL2024-10-01T22 and compare it with the previously developed Spectral Component Imaging (SCI) method, as well as classical imaging approaches. The reconstructed thermal and non-thermal components show good agreement with those obtained using SCI. This proof-of-concept study shows that CCI obtains results consistent with SCI but with fewer inputs. In contrast with SCI, CCI can also be applied to hard X-ray focusing optics imaging.
