arXivDaily arXiv每日学术速递 周一至周五更新
arXiv周末暂无论文更新,休息一下吧,周末愉快~~

用于多光照/多聚焦显示图像异常检测的对比知识蒸馏

Contrastive Knowledge Distillation for Anomaly Detection in Multi-Illumination/Focus Display Images

Jihyun Lee, Hangil Park, Yongmin Seo, Taewon Min, Joodong Yun, Jaewon Kim, Tae-Kyun Kim

arXiv 2609.05520首次发表:更新:

发表机构

KAIST; Hanyang University; Samsung Display(韩国科学技术院; 汉阳大学; 三星显示)

机构由 AI 辅助整理,请以论文原文为准。

AI 中文总结

针对多光照/多聚焦显示图像异常检测,提出基于对比蒸馏(MCD)和混合模块的方法,在MMdAD数据集上显著超越现有方法。

AI 中文摘要

本文研究了多光照和多聚焦显示图像中的自动异常检测问题。显示表面上的细微缺陷在RGB图像中难以被发现,且仅用正常数据训练的模型也难以识别这些缺陷。为解决这一问题,我们提出了一种新颖的对比学习方案,用于基于知识蒸馏的异常检测。在我们的框架中,采用多分辨率知识蒸馏(MKD)作为基线,该方法通过测量教师网络与学生网络之间的特征相似性来运行。基于MKD,我们提出了一种新颖的对比学习方法,即多分辨率对比蒸馏(MCD),该方法不需要带有锚点的正/负样本对,而是通过拉近或推远教师与学生特征之间的距离来运行。此外,我们提出了一个混合模块,将多通道信息转换并聚合到MCD的三通道输入层中。在我们收集的多光照和多聚焦显示图像异常检测数据集(MMdAD)上,我们提出的方法在AUROC和准确率指标上均显著优于现有的最先进方法。

英文摘要

In this paper, we tackle automatic anomaly detection in multi-illumination and multi-focus display images. The minute defects on the display surface are hard to spot out in RGB images and by a model trained with only normal data. To address this, we propose a novel contrastive learning scheme for knowledge distillation-based anomaly detection. In our framework, Multiresolution Knowledge Distillation (MKD) is adopted as a baseline, which operates by measuring feature similarities between the teacher and student networks. Based on MKD, we propose a novel contrastive learning method, namely Multiresolution Contrastive Distillation (MCD), which does not require positive/negative pairs with an anchor but operates by pulling/pushing the distance between the teacher and student features. Furthermore, we propose the blending module that transforms and aggregate multi-channel information to the three-channel input layer of MCD. Our proposed method significantly outperforms competitive state-of-the-art methods in both AUROC and accuracy metrics on the collected Multi-illumination and Multi-focus display image dataset for Anomaly Detection (MMdAD).

CommentsMVA 2023 (Oral)

Journal ref2023 18th International Conference on Machine Vision and Applications (MVA)

DOI:10.23919/MVA57639.2023.10215808

论文原文

arXiv 摘要页 · PDF 原文 · HTML 原文

↑