发表机构
JEOL Ltd.; Nara Institute of Science and Technology; Institute of Science Tokyo（日本电子株式会社; 奈良先端科学技术大学院大学; 东京科学大学）
机构由 AI 辅助整理，请以论文原文为准。AI 中文总结
该研究在4D-STEM框架下，采用多孔光阑产生的多角度电子束，消除了DPC-STEM磁成像中的晶体衍射衬度，实现了高灵敏度磁信息获取，并可分析磁畴结构与畴壁。
AI 中文摘要
差分相衬（DPC）扫描透射电子显微镜（STEM）技术的最新发展，借助高灵敏度探测器和强大的数据处理能力，极大推动了材料科学的进步。特别是采用像素化相机作为STEM探测器的4D-STEM技术，可通过对大型数据集的后处理实现广泛的信息获取。然而，利用DPC进行磁场或电场成像时常受到晶体材料本征的衍射衬度干扰。本文中，我们展示了在4D-STEM框架内，利用多孔光阑产生的角向分布多电子束，可消除衍射衬度以实现磁场成像。这种多角度束配置抑制了无关的晶体衬度，能从样品中直接获取高灵敏度的磁信息。此外，我们开展了多种图像分析，以提取和解释磁畴结构与畴壁。
英文摘要
Recent development of the differential phase contrast (DPC) scanning transmission electron microscopy (STEM) technique has significantly advanced materials science supported by high-sensitivity detectors and powerful data processing. Especially the 4D-STEM technique, employing a pixelated camera as a STEM detector, enables extensive information acquisition through post-processing of large datasets. However, magnetic or electric field imaging using DPC is often disturbed by diffraction contrasts intrinsic to the crystalline material. In this paper, we demonstrate elimination of the diffraction contrasts for magnetic field imaging by using angularly distributed multiple electron beams generated by a multi-hole aperture within the 4D-STEM framework. This multi-angle beam configuration suppresses irrelevant crystalline contrast and yields direct magnetic information with high sensitivity from the specimen. Furthermore, we performed various image analysis to extract and interpret magnetic domain structures and domain walls.
