发表机构
McMaster University（麦克马斯特大学）
机构由 AI 辅助整理，请以论文原文为准。AI 中文总结
该研究提出开源analog-db数据库，以领域特定语言实现模拟电路的可共享表示与复用，验证了其在调节器电路中的正确性，且AI智能体可基于其修复运算放大器设计缺陷。
AI 中文摘要
共享模拟集成电路设计仍存在诸多困难：晶圆厂保密协议限制了设计所依赖的工艺细节，已发表结果背后的测试平台也极少被公开。我们提出了analog-db，这是一个基于可共享设计表示构建的开源、版本化数据库。一种领域特定语言将每个设计捕获为工艺中立的拓扑结构、可复用的测试平台以及机器可读的 datasheet（数据手册），三者置于同一架构下，因此设计可完整共享，并能在其绑定的工艺套件上重新仿真。参数化方案将功能子模块和器件尺寸作为带有匹配约束的命名参数公开，使电路具备可组合性和可重定向性；架构管控的契约和可查询的目录让AI设计智能体能够直接发现并复用这些电路。在调节器语料库中，三个开源工艺套件上的全部23种电路-套件绑定均满足各自记录的规格范围（典型工艺角、匹配器件、无版图），且23种绑定中有10种满足通用类别范围。23种导入的尺寸设计中有17种在其测试平台上失败，且在由标注的子模块角色驱动的gm/ID尺寸循环下无法闭合，通常在1至3次迭代内即可修复。在一项监督案例研究中，基于公开工件工作的编码智能体在开源130nm工艺套件上对斩波仪表放大器的运算放大器核心进行了尺寸设计，发现了4个人工输入缺陷以及一个仅进行尺寸设计的基线未修复的缺失共模反馈环路。该数据库包含16个类别共68个电路，可在分层测试平台下于原理图级别验证，并在功耗/性能记分板上进行跟踪，已在该httpsURL发布。
英文摘要
Sharing analog integrated circuit designs remains difficult: foundry non-disclosure agreements restrict the process details a design depends on, and the testbenches behind published results are rarely released. We present analog-db, an open-source, versioned database built on a shareable design representation. A domain-specific language captures each design as a process-neutral topology, reusable testbenches, and a machine-readable datasheet under one schema, so a design is shared in full and re-simulates on the process kits it is bound to. A parameterization scheme exposes functional sub-blocks and device sizes as named parameters that carry their matching constraints, making circuits composable and retargetable; a schema-governed contract and queryable catalog let AI design agents discover and reuse them directly. Across the regulator corpus, all 23 circuit-kit bindings on three open kits meet their own recorded specification bands (typical corner, matched devices, no layout) and 10 of 23 meet a common class band. Seventeen of the 23 imported sizings failed their testbenches and closed under a gm/ID sizing loop driven by the annotated sub-block roles, typically within one to three iterations. In a supervised case study, a coding agent working from the released artifacts sized the op-amp cores of a chopper instrumentation amplifier on an open 130nm kit, locating four hand-entry defects and a missing common-mode feedback loop that the sizing-only baseline did not repair. The database holds 68 circuits across sixteen classes, verifiable at schematic level under a tiered harness and tracked on a power/performance scoreboard, released at https://github.com/MacAnalog/spicexplorer-release.
Comments23 pages, 5 figures, and 13 tables
