AI 中文总结
研究在SSRF上表征USTC-IME LGAD在聚焦X射线下的时间性能，采用波形级全局模板拟合与联合剖面似然法，测得时间分辨率为126.6ps，还研究了光子吸收深度对其时间分辨率的影响。
AI 中文摘要
在中国科学院上海应用物理研究所的上海同步辐射装置（SSRF）上，对由中国科学技术大学（USTC）设计、中国科学院微电子研究所（IME）制备的低增益雪崩二极管（LGAD）的时间性能进行了表征。实验在BL16B1束线开展，该束线提供的聚焦X射线束直径为500μm，重复周期为2ns，光子能量为10keV。采用快速示波器在50ns时间窗口内记录包含连续信号脉冲的波形，待测LGAD成功分辨出SSRF的2ns周期。为缓解堆积效应并从采集的波形中提取逐脉冲信息，采用了波形级全局模板拟合方法。随后通过联合剖面似然法估算时间分辨率，得到值为126.6ps。还通过专门的模拟研究了随机光子吸收深度对LGAD时间分辨率的影响。
英文摘要
The time performance of Low Gain Avalanche Diodes (LGADs), designed by the University of Science and Technology of China (USTC) and fabricated by the Institute of Microelectronics of Chinese Academy of Sciences (IME), was characterized at the Shanghai Synchrotron Radiation Facility (SSRF). The experiment was conducted at the BL16B1 beamline, which delivers a focused X-ray beam with a diameter of 500 μm, a repetition period of 2 ns, and a photon energy of 10 keV. Using a fast oscilloscope, waveforms containing continuous signal pulses were recorded within a 50 ns time window. The LGAD under test successfully resolved the 2 ns period of the SSRF. To mitigate pile-up effects and extract pulse-by-pulse information from the acquired waveforms, a waveform-level global template fitting method was employed. The time resolution was then estimated using a combined profile likelihood approach, yielding a value of 126.6 ps. The effect of random photon absorption depth on the time resolution of LGADs was studied through dedicated simulations.
Comments14 pages, 19 figures
