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arXiv 2608.30313quant-phphysics.optics

耗散克尔孤子的量子干涉计量学

Quantum-interference metrology of dissipative Kerr solitons

Yun-Ru Fan, Yong Geng, Ji Liu, Yong-Jun Huang, Hai-Zhi Song, Hao Li, Li-Xing You, Heng Zhou, Kun Qiu, Kai Guo, Guang-Can Guo, Qiang Zhou

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中文总结 AI 辅助

该研究提出基于Hong-Ou-Mandel干涉的量子计量学,无需放大或色散补偿即可准确表征耗散克尔孤子的时间结构,可实现多孤子态的亚皮秒级测量,为孤子物理研究提供新工具。

中文摘要 AI 辅助

光微谐振器中的耗散克尔孤子是芯片级频率梳的基础,应用范围从相干电信到精密光谱学。然而,其固有飞秒时间结构的表征仍具挑战性,因为低脉冲能量和宽光谱带宽需要在传统超快诊断中进行光放大和精细色散补偿,两者都会显著扭曲波形。本文展示了基于Hong-Ou-Mandel干涉的微梳孤子量子干涉计量学,通过将孤子流衰减至单光子水平并测量四阶干涉,无需放大或色散管理即可直接获取近变换极限的脉冲持续时间,即使在25公里标准光纤中传输后仍保持准确。同一干涉图还可通过将孤子间间隔转换为对应延迟处的额外干涉凹陷,直接获取多孤子态中的时间间隔,实现其腔内时间结构的亚皮秒表征。这一量子启发范式引入了一种根本上新型的计量方法,不受放大和色散扭曲的影响,为复杂孤子物理的表征提供了强大工具。

英文摘要

Dissipative Kerr solitons in optical microresonators underpin chip-scale frequency combs with applications ranging from coherent telecommunications to precision spectroscopy. Yet the characterization of their intrinsic femtosecond temporal structure remains challenging, as the low pulse energy and broad spectral bandwidth necessitate optical amplification and careful dispersion compensation in conventional ultrafast diagnostics, both of which can significantly distort the waveform. Here we demonstrate a quantum-interference metrology of microcomb solitons based on Hong-Ou-Mandel interference. By attenuating the soliton stream to the single-photon level and measuring fourth-order interference, we directly retrieve near transform-limited pulse durations without amplification or dispersion management, remaining accurate even after propagation through 25 km of standard fiber. The same interferogram also provides direct access to the temporal separations in multi-soliton states by converting inter-soliton separations into additional interference dips at corresponding delays, enabling sub-picosecond characterization of their intracavity temporal structure. This quantum-inspired paradigm introduces a fundamentally new metrological approach that is immune to amplification and dispersion distortions, offering a powerful tool for the characterization of complex soliton physics.

发表机构

  • University of Electronic Science and Technology of China(电子科技大学)
  • Tianfu Jiangxi Laboratory(天府江西实验室)
  • Southwest Institute of Technical Physics(西南技术物理研究所)
  • Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences(中国科学院上海微系统信息技术研究所)
  • AMS
  • University of Science and Technology of China(中国科学技术大学)

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