基于体积积分方程与流体力学方程耦合系统的复合纳米结构特征模式分析

中文摘要 AI 辅助

针对复合金属-电介质纳米结构，本文基于体积积分方程（VIE）与流体力学方程（HDE）的耦合系统，开发了全结构与子结构两种特征模式分析（CMA）公式。在全结构CMA中，广义特征值方程（GEE）由完整耦合系统的矩阵构建，所得特征电流描述整个复合纳米结构的响应。在子结构CMA中，GEE由简化系统构建，该系统通过消除电介质区域的未知量从耦合系统推导而来，仅用金属区域的电流表示，从而分离出金属区域的共振，同时仍通过简化系统纳入电介质区域的影响。由于简化系统维度更小，子结构CMA的计算效率高于全结构CMA；当电介质在感兴趣的频率范围内不发生共振时，二者可识别出相同的共振。两种公式均通过消光截面（ECS）结果验证，并用于表征电介质环境如何重塑金属共振，包括衬底诱导的红移，以及直接接触的高对比度衬底产生的杂化模态响应。

英文摘要

Full-structure and sub-structure characteristic mode analysis (CMA) formulations are developed for composite metallic--dielectric nanostructures based on a coupled system of volume integral equations (VIE) and the hydrodynamic equation (HDE). In the full-structure CMA, the generalized eigenvalue equation (GEE) is constructed from the matrix of the complete coupled system, and the resulting characteristic currents describe the response of the entire composite nanostructure. In the sub-structure CMA, the GEE is constructed from a reduced system, derived from the coupled system by eliminating the dielectric-region unknowns, so that it is expressed only in terms of the metallic-region currents. This isolates the resonances of the metallic region while still incorporating the effect of the dielectric region through the reduced system. Because the reduced system has a smaller dimension, the sub-structure CMA is computationally more efficient than the full-structure CMA and, when the dielectric does not resonate in the frequency range of interest, identifies the same resonances. Both formulations are validated against extinction cross-section (ECS) results and are used to characterize how a dielectric environment reshapes the metallic resonances, including substrate-induced red-shifts and, for high-contrast substrates in direct contact, hybridized modal responses.

发表机构

• King Abdullah University of Science and Technology (KAUST)（阿卜杜拉国王科技大学）
• University of Electronic Science and Technology of China (UESTC)（电子科技大学）
• Light Academy College of Engineering（光学院工程学院）

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