Belle II TOP探测器特征提取从Zynq处理系统向PCIe40读出PC的迁移
Migration of Belle II TOP Feature Extraction from the Zynq Processing System to PCIe40 Readout PCs
中文总结 AI 辅助
本文将Belle II TOP探测器的波形特征提取从辐射环境中的Zynq PS迁移至探测器外的PCIe40 ROPC，消除了PS锁死问题，使TOP死时间降至近零，在高触发率下实现稳定运行并保持PID性能。
中文摘要 AI 辅助
Belle II飞行时间（TOP）探测器是带电粒子识别（PID）的关键系统。尽管TOP在Belle II初期数据采集阶段运行成功，但不断提高的亮度和束流诱发的本底导致暴露于辐射环境的Zynq片上系统（SoC）中单粒子翻转（SEU）频率升高，由此引发的嵌入式处理系统（PS）锁死中断了数据采集。为缓解这一限制，原本在探测器端Zynq PS上执行的关键任务——波形特征提取，被迁移至探测器外的PCIe40读出PC（ROPC）。新架构在事例数据通路中绕过PS，在探测器辐射环境外执行特征提取，这一改动消除了事例数据通路中SEU诱发的PS锁死，使TOP前端电子学和Belle II数据采集系统在更高亮度和本底条件下稳定运行。TOP典型死时间从约1%降至最终固件补丁后的接近零水平，且在Level-1（L1）触发率为30 kHz、微通道板光电倍增管（MCP-PMT）的单管击中率约5 MHz的条件下，已验证稳定运行。本文阐述了该迁移后的架构、其部署与验证，以及运行性能和PID性能。
英文摘要
The Belle II Time-of-Propagation (TOP) detector is a key system for charged-particle identification (PID). Although TOP operated successfully during initial Belle II data taking, increasing luminosity and beam-induced background led to more frequent single-event upsets (SEUs) in the radiation-exposed Zynq systems-on-chip (SoCs). Resulting lockups of the embedded processing systems (PSs) interrupted data acquisition. To mitigate this limitation, waveform feature extraction, a critical task of the on-detector Zynq PS, was migrated to the off-detector PCIe40 readout PCs (ROPCs). The new architecture bypasses the PS in the event data path and performs feature extraction outside the detector radiation environment. This change removed SEU-induced PS lockups from the event data path and enabled stable operation of the TOP front-end electronics and the Belle II data-acquisition system under increased luminosity and background conditions. The typical TOP deadtime decreased from about 1% to a level consistent with zero after the final firmware patch, and stable operation was demonstrated at a Level-1 (L1) trigger rate of 30 kHz with a microchannel-plate photomultiplier-tube (MCP-PMT) hit rate of approximately 5 MHz per PMT. This paper describes the migrated architecture, its deployment and validation, and its operational and PID performance.
