AI 中文总结
该研究针对传统极化表征技术无法分析铁电薄膜畴相关可靠性机制的问题，提出三畴模型结合互补开关电流测量的畴解耦方法，可定量追踪畴演化，为研究铁电器件可靠性现象提供新途径。
AI 中文摘要
传统极化表征技术仅能提供铁电薄膜的平均响应，限制了对HfO₂基铁电体中与畴相关的可靠性机制的研究。本研究提出一种新的畴解耦方法，用于分别分析具有不同开关行为的铁电畴。首先引入由不可开关的向上畴、不可开关的向下畴和可开关畴（Pd）组成的三畴模型，以描述电循环过程中的异质畴群体。通过结合互补的开关电流测量，可选择性提取并重构不同畴群体的响应。该方法能够定量追踪循环过程中单个畴群体的变化。作为演示，该方法还被用于分析电循环后畴群体的时间依赖性演化。此方法为研究铁电器件中的印记、疲劳及其他与可靠性相关的现象提供了新途径。
英文摘要
Conventional polarization characterization techniques provide only the averaged response of ferroelectric films, limiting the investigation of domain-dependent reliability mechanisms in HfO2-based ferroelectrics. In this work, a new domain decoupling method is proposed to separately analyze ferroelectric domains with distinct switching behaviors. A three-domain model consisting of upward non-switchable domains, downward non-switchable domains, and switchable domains (Pd) is first introduced to describe heterogeneous domain populations during electrical cycling. By combining complementary switching-current measurements, the responses of different domain populations can be selectively extracted and reconstructed. The proposed method enables quantitative tracking of individual domain populations during cycling. As a demonstration, the method is further applied to analyze the time-dependent evolution of domain populations after electrical cycling. This approach provides a new route for investigating imprint, fatigue, and other reliability-related phenomena in ferroelectric devices.
