分形拓扑绝缘体边缘的局域化特征
Signatures of localization on the edge of a fractional topological insulator
AI总结：
本研究针对分形拓扑绝缘体边缘，识别出3种部分局域化通道，结合电导与最小准粒子电荷可区分各相，为其输运性质研究提供关键标识。
AI中文摘要：
近期范德华莫尔材料领域的实验已实现二维分形拓扑绝缘体（FTI）。我们研究填充因子为ν_FTI=2(1±1/n)（n为≥2的整数，可偶可奇）的FTI边缘的输运性质，该填充因子下每个边缘支持4种反向传播的边缘模式。边缘模式可发生部分局域化，使4种边缘模式中的2种保持传导。我们识别出3种不同的部分局域化通道，并针对每种通道确定描述剩余传导模式的简化理论，由此得到最小准粒子电荷。我们进一步探究每种部分局域化相的输运性质，尤其确定对应的边缘电导。我们证明，电导测量与最小准粒子电荷相结合，可作为唯一区分3种部分局域化相的特征标识。
英文摘要：
Recent experiments in van der Waals moiré materials have reported realizations of two-dimensional fractional topological insulators (FTIs). We study transport properties of FTI edges at filling factors $ν_{\text{FTI}} = 2(1\pm 1/n)$ with integer $n \geq 2$ (even or odd), each of which supports four counter-propagating edge modes. The edge modes can undergo partial localization, leaving two of the four edge modes conducting. We identify three distinct partial-localization channels and, for each channel, determine the reduced theory describing the remaining conducting modes, from which we obtain the minimal quasiparticle charge. We further explore transport properties of each partially localized phase and in particular determine the corresponding edge conductances. We demonstrate that measurements of the conductance together with the minimal quasiparticle charge provide a fingerprint that uniquely distinguishes the three partially localized phases.
