基于采集几何辅助的光学显微镜图像中X射线荧光图谱的全组定位
Acquisition Geometry-Assisted Whole-Group Localization of X-ray Fluorescence Maps in Optical Microscopy Images
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- Northwestern University（西北大学）
- University of Chicago（芝加哥大学）
- Oregon Health and Science University（俄勒冈健康与科学大学）
- Argonne National Laboratory（阿贡国家实验室）
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中文总结 AI 辅助
该研究针对XRF图谱在光学图像中定位困难的问题，提出基于采集几何约束的全组定位方法，通过GroupIoU量化，实验显示其定位精度优于独立定位，且不依赖特定相似性度量。
中文摘要 AI 辅助
X射线荧光（XRF）显微镜可绘制元素分布图谱，而光学显微镜能提供互补的形态学背景。由于两种模态的对比度机制和分辨率存在差异，将XRF视场（FOV）定位在光学图像中十分困难。当前多数工作独立放置每个XRF图块，即便采集元数据已记录图块的相对扫描位置。本研究将XRF图块组定位形式化，即基于采集几何约束为整个图块组估计一个光学帧放置位置，并采用组交并比（GroupIoU）进行量化。在受控案例研究中，独立定位的GroupIoU为0.000，而组定位的GroupIoU达到0.931；将归一化互相关（NCC）度量替换为互信息（MI）后结果几乎一致，表明结果不依赖于某一局部相似性度量。在另一多尺度案例研究中，采用粗尺度XRF普查扫描将细尺度图块组与光学图像关联，使平均GroupIoU从0.694提升至0.856。这些案例研究支持在定位相关XRF图块时，将采集几何作为显式约束使用。
英文摘要
X-ray fluorescence (XRF) microscopy maps elemental distributions, while optical microscopy can provide complementary morphological context. Localizing XRF fields of view (FOVs) in optical images is difficult because the two modalities differ in contrast mechanism and resolution. Most current workflows place each XRF tile independently, even when acquisition metadata already record the tiles' relative scan positions. This study formalizes XRF tile-group localization, in which one optical-frame placement is estimated for the whole group, constrained by acquisition geometry and quantified using group intersection-over-union (GroupIoU). In a controlled case study, independent localization failed with GroupIoU 0.000, whereas group localization achieved 0.931. Replacing the normalized cross-correlation (NCC) metric with mutual information (MI) gave nearly identical results, showing that the outcome is not specific to one local similarity metric. In another multiscale case study, using a coarse XRF survey scan to connect the fine-scale tile group to the optical image increased mean GroupIoU from 0.694 to 0.856. These case studies support using acquisition geometry as an explicit constraint when localizing related XRF tiles.
