AI 中文总结
本文针对扫描X波段雷达阵列，提出探针位置匹配的闭式设计方法，将最坏情况反射优化转化为拟凸问题，应用于16单元阵列及二维晶格后显著改善了反射性能。
AI 中文摘要
微带单元的探针位置通常从孤立单元的输入电阻中选取，本文用阵列优化前即可获得的决策替代该过程。任意探针位置处的单个Floquet单元解可分解为馈电电感、携带探针位置的变压器变比及阵列加载谐振器，由此得到三个闭式结果：探针位置和谐振长度可实现的输入阻抗集合是阻抗平面内的一个圆盘；仅当Rp ≥ Z0 + Xp²/Z0时，才存在与实参考阻抗Z0的精确匹配；若该条件不满足，可通过双线性映射下该圆盘的像得到最优可实现反射。若将一个串联电抗作为第二个变量，扫描扇区内的最坏情况反射被证明是拟凸的，可通过二分法全局求解。将上述结果应用于16单元X波段阵列及对应的16×24晶格：所考虑阵列的孤立内部单元匹配至-16.94 dB，正侧射有源反射为-6.6 dB；二维晶格在所有扫描角度均违反匹配准则，极小极大设计将扇区最坏情况反射从-2.6 dB提升至-11.1 dB。两种匹配设计均为提取电路模型的预测结果，未在全波模型中重新求解。
英文摘要
The probe position of a microstrip element is normally chosen from the isolated-element input resistance. This paper replaces that procedure with a decision available before any array optimisation. A single Floquet unit-cell solution at one arbitrary probe position is decomposed into a feed inductance, a transformer ratio carrying the probe position, and an array-loaded resonator. Three closed-form results follow. The set of input impedances reachable by probe position and resonant length is a disk in the impedance plane. An exact match to a real reference Z0 exists if and only if Rp >= Z0 + Xp^2/Z0. When this fails, the best attainable reflection follows from the image of that disk under the bilinear map. Admitting one series reactance as a second variable, the worst-case reflection over a scan sector is shown to be quasiconvex and globally solvable by bisection. The results are applied to a sixteen-element X-band array and the corresponding 16x24 lattice. For the array considered, the isolated interior element is matched to -16.94 dB while the broadside active reflection is -6.6 dB. For the two-dimensional lattice the criterion is violated at every scan angle, and the minimax design improves the worst-case sector reflection from -2.6 to -11.1 dB. Both matching designs are predictions of the extracted circuit model and have not been re-solved in the full-wave model.
