快速叠层衍射近场计算机断层扫描
Fast Ptychographic Near-Field Computed Tomography
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中文总结 AI 辅助
该研究提出环境条件下运行的可调几何近场叠层衍射装置，通过飞转式运动将扫描开销降11倍，搭配20微米级样品研磨机，缩短了近场X射线纳米断层扫描的时间与制备难度，推动其在生物研究中的应用。
中文摘要 AI 辅助
近场X射线叠层衍射可实现纳米级分辨率的定量三维成像，但其更广泛的应用受限于漫长的采集时间（通常需要低温或真空环境）以及严苛的样品制备流程。本文提出一种可在环境条件下运行的灵活近场叠层衍射装置，具备适配不同样品尺寸和分辨率需求的可调几何结构。通过用飞转式样品运动替代步进式角采集，扫描开销降低11倍，大幅缩短了断层扫描时间。为解决样品制备的瓶颈，还引入了一种样品研磨机，可快速制备直径低至20微米的样品柱。该系统在保持高空间分辨率的同时，降低了制备工作量和测量时间，克服了近场叠层衍射的关键限制，使定量X射线纳米断层扫描更易于应用于生物学研究。
英文摘要
Near-field X-ray ptychography enables quantitative three-dimensional imaging with nanometer-scale resolution, but its broader application is limited by long acquisition times - often necessitating cryogenic or vacuum environments - and demanding sample preparation procedures. In this paper, we present a flexible near-field ptychography setup that operates under ambient conditions and features an adjustable geometry for different sample sizes and resolution requirements. By replacing stepwise angular acquisition with a fly-rotation sample motion, the scanning overhead is reduced by a factor of 11, drastically lowering the tomographic scan time. To address the bottleneck in sample preparation, we also introduce a sample milling machine that enables fast preparation of specimen pillars with diameters down to 20 um. By lowering both preparation effort and measurement time while maintaining high spatial resolution, the presented system overcomes key limitations of near-field ptychography and makes quantitative X-ray nanotomography substantially more accessible for biological research.
