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通过未来多TeV缪子对撞机上的带电希格斯对产生探测暗物质:一项机器学习分析

Probing dark matter through charged Higgs pair production at future multi-TeV muon colliders: A machine-learning analysis

Khiem Hong Phan, Quang Hoang-Minh Pham

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中文总结 AI 辅助

本文在惰性二重态模型框架下,结合理论与实验约束更新参数空间,采用机器学习方法研究未来多TeV缪子对撞机上带电希格斯对产生过程,实现统计显著性超5σ的暗物质间接探测。

中文摘要 AI 辅助

本文在惰性二重态模型(IDM)框架下,研究通过未来多TeV缪子对撞机上的带电希格斯对产生过程探测暗物质(DM)。首先结合理论约束与当前实验数据更新IDM的可行参数空间,基于该允许参数空间计算DM的遗迹密度,并将结果与最新的直接DM探测实验约束进行对比。随后,采用所有DM约束均一致的参数点,研究未来多TeV缪子对撞机上的带电希格斯对产生过程,包括带电希格斯玻色子衰变为标准模型(SM)粒子并伴随DM候选粒子的后续衰变。具体研究的产生过程包括:μ⁻μ⁺→ν_μν̄_μH⁺H⁻→ℓ⁺ℓ⁻+ν_μν̄_μν_ℓν̄_ℓHH、μ⁻μ⁺→ν_μν̄_μH⁺H⁻→ℓ^±+2喷注+ν_μν̄_μν_ℓHH、μ⁻μ⁺→ν_μν̄_μH⁺H⁻→4喷注+ν_μν̄_μHH,其中ℓ为电子或缪子。采用基于判选(cut-based)和机器学习(ML)两种方法,评估信号相对于对应SM本底的显著性。研究发现,与传统的基于判选的分析相比,机器学习框架显著提升了对信号过程的灵敏度。此外,研究结果表明,在未来多TeV缪子对撞机上,针对多个可行基准点,通过带电希格斯对产生的DM信号可被间接探测到,且统计显著性超过5σ。

英文摘要

Probing dark matter (DM) via charged Higgs pair production at future multi-TeV muon colliders is investigated within the Inert Doublet Model (IDM). The viable parameter space of the IDM is first updated by incorporating theoretical constraints and current experimental data. Based on the allowed parameter space, we evaluate DM relic density and compare the results with the latest constraints from direct DM detection experiments. The resulting parameter points consistent with all DM constraints are subsequently employed to study charged Higgs pair production at future multi-TeV muon colliders, including the subsequent decays of the charged Higgs bosons into Standard Model (SM) particles in association with DM candidate. In particular, we study the following production processes: $μ^- μ^+ \to ν_μ \barν_μ H^{\pm} H^{\mp} \to \ell^+ \ell^- + ν_μ \barν_μ ν_{\ell} \barν_{\ell} HH$, $μ^- μ^+ \to ν_μ \barν_μ H^{\pm} H^{\mp} \to \ell^\pm + 2\,\text{jets} + ν_μ \barν_μ ν_{\ell} HH$ and $μ^- μ^+ \to ν_μ \barν_μ H^{\pm} H^{\mp} \to 4\,\text{jets} + ν_μ \barν_μ HH$ for $\ell =e, μ$. The signal significance is evaluated against the corresponding SM backgrounds using both cut-based and machine-learning (ML) approaches. We find that ML framework substantially enhances the sensitivity to the signal processes compared with the conventional cut-based analysis. Furthermore, our results indicate that the DM signals through charged Higgs pair production can be indirectly probed with a statistical significance exceeding $5σ$ for several viable benchmark points at future multi-TeV muon colliders.

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