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X波段同轴-波导适配器附加长度去嵌入方法的精度分析

An Analysis of the Accuracy of the Added Length De-Embedding Methods for Coaxial to Waveguide Adapters in the X-Band

Eric Bauman, James DePoy, Sterling Light, Arya Menon, Marco Iskander

arXiv 2608.06313首次发表:更新:

AI 中文总结

本文对比X波段同轴-波导适配器附加长度法与全波导校准的精度,探讨成本与测量精度的权衡,得出该方法仅传输测量结果准确的结论。

AI 中文摘要

本文评估了X波段同轴-波导过渡件附加长度法(又称端口延伸或信道偏移)的精度,并将其与是德科技(Keysight)和罗德与施瓦茨(Rohde & Schwarz)矢量网络分析仪(VNA)上的全波导校准进行比较。该研究探讨了成本与测量精度之间的权衡,强调在没有专用波导校准套件或过渡件完整S参数表征的情况下,使用这些数学校正技术的可行性。分析得出,使用同轴-波导过渡件时,附加长度法仅对传输测量能产生准确结果。

英文摘要

This paper assesses the accuracy of the "added length method" (also known as port extension or channel offset) for de-embedding coaxial-to-waveguide transitions in the X-band, comparing it to full waveguide calibration on both Keysight and Rohde & Schwarz VNAs. The study examines the trade-offs between cost and measurement accuracy, highlighting the feasibility of using these mathematical correction techniques in the absence of dedicated waveguide calibration kits or full S-parameter characterizations of the transitions. The analysis concluded that when using coaxial-to-waveguide transitions the added length method produces accurate results for transmission measurements only.

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