AI 中文总结
研究针对重复投影测量系统推导两种量子涨落关系，明确标准量子Jarzynski等式的对数修正项，应用Jensen不等式设定功的基本限制，为量子器件功提取研究提供理论支撑。
AI 中文摘要
我们针对经历重复投影测量的系统推导了两种量子涨落关系。这些涨落关系描述了当首次探测事件触发产生正功的机械操作时，可从量子器件中提取的功。标准量子Jarzynski等式的修正项与时间反演动力学的平均首次探测时间呈对数相关。应用Jensen不等式可对重复测量及最终机械操作涉及的总功、仅提取的功设定基本限制，同时也考虑了器件连接外部环境的一般情况。
英文摘要
We derive two quantum fluctuation relations for systems undergoing repeated projective measurements. These fluctuation relations characterize the work that can be extracted from a quantum device when a first-detection event triggers a mechanical operation leading to positive work production. The correction to the standard quantum Jarzynski equality depends logarithmically on the mean first-detection time for the time-reversed dynamics. Application of Jensen's inequality leads to fundamental limits on both the total work involved in the repeated measurements and final mechanical operation, and the extracted work alone. The general case of a device connected to an external environment is also considered.
