AI 中文总结
该研究通过分析弱测量中仪表系统的量子动力学，建立了后选择概率与仪表读数统计中量子干涉的普适关系，揭示了计干扰的统计模式可用于排除弱值实验观测中的统计假象。
AI 中文摘要
人们普遍认为，弱测量中仪表读数的量子波动使得无法识别源于测量所观测物理属性各个值的贡献。在此，我们表明对仪表系统量子动力学的仔细分析，可使我们识别出后选择概率中的量子干涉与仪表读数统计中的量子干涉之间的普适关系。该分析揭示量子干涉以两种方式改变仪表的读数分布：一是扩散项，其可确定所观测系统属性后选择方差中的适当算符排序；二是基于后作用对后选择概率的影响，对初始仪表统计进行依赖于波函数的更新。我们的结果表明，计干扰所描述的统计模式提供了关于弱测量中后选择物理的重要细节，使我们能够排除在弱值实验观测中存在统计假象的可能性。
英文摘要
It is widely assumed that the quantum fluctuations of the meter readout in a weak measurement make it impossible to identify the contributions originating from the individual values of the physical property observed in the measurement. Here, we show that a careful analysis of the quantum dynamics of the meter system allows us to identify a universal relation between quantum interference in the post-selection probability, and quantum interference in the statistics of the meter readout. The analysis reveals that quantum interference modifies the readout distribution of the meter in two ways, a diffusion term that identifies the appropriate operator ordering in the post-selected variance of the observed system property, and a wavefunction-dependent update of the initial meter statistics based on the effect of back action on the post-selection probability. Our results show that the statistical patterns described by meter interference provide important details about the physics of post-selection in weak measurements, allowing us to exclude the possibility of statistical artefacts in the experimental observation of weak values.
Comments13 pages
