基于金刚石中单个氮空位中心的可溯源扫描磁力测量方法：确定取向、距离与定位
Methods for traceable scanning magnetometry using single nitrogen vacancy centers in diamond: determining orientation, distance and localization
AI总结：
本研究开发了基于金刚石单个NV中心的扫描磁力测量方法，无需外部矢量磁控制即可精确测得NV与样品的距离、NV方位取向，还可检测表面污染并估算NV横向位置，实现了可溯源的纳米级磁成像。
AI中文摘要：
单晶金刚石纳米结构中单个可扫描的氮空位（NV）中心可实现对磁杂散场的纳米级定量成像。然而，NV中心与样品间的距离、NV高对称轴的取向等重要参数常无法精确获知，需作为自由拟合参数纳入数据评估。本研究对微图案化的垂直磁化条纹与圆盘开展扫描NV成像，无需外部矢量磁控制即可直接推断NV-样品距离d_NV与NV的方位取向，测得d_NV=31.5 nm，方位取向精度达3°。此外，采用商用硅针尖对金刚石纳米结构的顶点形貌成像以检测表面污染，同时通过监测NV荧光随针尖位置的变化，估算NV在金刚石纳米结构内的横向位置。
英文摘要：
Individual, scannable nitrogen vacancy (NV) centers in single crystal diamond nanostructures enable nanoscale, quantitative imaging of magnetic stray fields. Nevertheless, important parameters like distance between the NV center and the sample and the orientation of the NV high symmetry axis are often not known precisely and enter data evaluation as free fitting parameters. We here use scanning NV imaging on micro-patterned, perpendicularly magnetized stripes and discs. From these measurements, we directly infer NV - sample distance d_NV and the NV's azimuthal orientation without the need for an external vector magnet control. We determine d_NV = 31.5 nm, while we infer the azimuthal orientation with a precision of 3°. We additionally employ commercially available silicon needles to image the apex topography of our diamond nanostructures to detect surface contamination. Simultaneously, monitoring NV fluorescence as a function of the needle's position allows us to estimate the lateral placement of the NV inside the diamond nanostructure.
