用简单测量检测高维纠缠
Detecting high-dimensional entanglement with simple measurements
AI总结：
本文提出仅用单量子比特可观测量序列的简单测量方案，结合16维光子空间模式纠缠等技术，成功检测高维纠缠的施密特数，简化了装置复杂度且具可扩展性。
AI中文摘要：
高维纠缠的标准基准是生成该态所需的纠缠存在的维度数，称为施密特数，其检测通常基于实施一组合适的局域基测量。然而，随着量子技术使越来越大的物理维度成为可能，这类测量的实施通常成本更高。本文提出一种仅基于单量子比特可观测量序列的施密特数检测方案，这类测量更易实施，仅需低深度量子电路。利用高达16维的光子空间模式纠缠和多平面光转换技术，我们证明该方案简化了装置复杂度，成功检测到最大或接近最大的施密特数。我们的结果表明，简单且更具可扩展性的测量足以检测高维纠缠特性。
英文摘要：
The standard benchmark for high-dimensional entanglement is the number of dimensions in which entanglement must be present in order to generate the state. This is called the Schmidt number and its detection is usually based on implementing an appropriate set of local basis measurements. However, as quantum technology brings increasingly large physical dimensions within reach, the implementation of such measurements typically becomes more costly. Here, we develop a scheme for detecting Schmidt numbers based only on sequences of single-qubit observables. These measurements are simpler to implement as they require only low-depth quantum circuits. Using up to sixteen-dimensional photonic spatial mode entanglement and multi-plane light conversion technology, we demonstrate how it simplifies setup complexity and successfully detects the maximal (or close-to-maximal) Schmidt number. Our results reveal that simple and more scalable measurements are sufficient to detect high-dimensional entanglement properties.
