AI 中文总结
本研究以Tl2201为对象，发现低温FIB微结构加工可抑制常规FIB的氧流失损伤，制备的器件可定量测量c轴输运，解决了该材料输运与量子振荡测量的长期差异，确立了可靠的量子材料定量输运测量方法。
AI 中文摘要
关联量子材料的绝对输运测量常受无序、不均匀性、几何不确定性及晶体尺寸小的限制。聚焦离子束（FIB）技术可通过从晶体精心选定区域提取薄片制备几何精确的输运器件，克服诸多此类限制，但其在铜基超导体中的应用受离子束诱导损伤阻碍。本研究以清洁的过掺杂铜基超导体Tl2201为对象，发现常规FIB加工会引发热驱动氧流失，而低温FIB微结构加工可大幅抑制该降解，从体相到原子尺度保留晶体结构。微结构器件无需重新标度即可定量复现已确立的面内电阻率与霍尔载流子密度测量结果。将该方法应用于c轴输运，获得的绝对ρ_c(T)值约为此前报道的3倍，在各向同性弛豫时间近似下，使输运各向异性与已知费米面几何结构定量吻合。这些结果解决了过掺杂Tl2201中输运与量子振荡测量间长期存在的差异，并确立低温FIB微结构加工技术为在无序、不均匀性、几何或小晶体尺寸此前限制实验精度的量子材料中实现可靠定量输运测量的途径。
英文摘要
Absolute transport measurements in correlated quantum materials are often limited by disorder, inhomogeneity, geometric uncertainty, and small crystal size. Focused ion beam (FIB) technology offers a route to overcome many of these limitations by enabling transport devices with precisely defined geometry to be fabricated from lamellae extracted from carefully selected regions of a crystal, but its application to cuprate superconductors has been hindered by ion-beam-induced damage. Here we study the clean overdoped cuprate Tl2201 and show that conventional FIB processing causes thermally driven oxygen loss, while cryogenic FIB microstructuring largely suppresses this degradation and preserves the crystal structure from the bulk to the atomic scale. Microstructured devices quantitatively reproduce established in-plane resistivity and Hall carrier density measurements without rescaling. Applying this approach to $c$-axis transport, we obtain absolute $ρ_c(T)$ values approximately three times larger than previously reported, bringing the transport anisotropy into quantitative agreement with the known Fermi surface geometry within an isotropic relaxation-time approximation. These results resolve a long-standing discrepancy between transport and quantum oscillation measurements in overdoped Tl2201 and establish cryogenic FIB microstructuring as a route to reliable quantitative transport measurements in quantum materials where disorder, inhomogeneity, geometry, or small crystal size have previously limited experimental accuracy.
