基于随机探针成像的断层相位成像
Tomographic Phase Imaging with Randomized Probe Imaging
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中文总结 AI 辅助
该研究首次将随机探针成像（RPI）应用于断层相位成像，实现了亚100 nm分辨率的立方金纳米颗粒三维成像，相比ptychography大幅提速且结果高度一致。
中文摘要 AI 辅助
我们展示了对立方金纳米颗粒的断层相位成像，其分辨率低于100 nm，每个投影仅需一张远场相干衍射图样。通过使用随机探针成像（RPI），可从单张衍射图样重建实空间振幅和相位图像，随后将这些相位图像输入标准断层成像工作流以获取三维体积。纳米级X射线相位断层成像常依赖ptychography，该技术需对每个投影进行缓慢的二维扫描。使用RPI可大幅加快数据采集速度，代价是损失部分分辨率。我们将RPI断层成像的三维体积与同一样本的ptychography断层成像结果对比，发现两种方法高度一致。据我们所知，这是RPI首次应用于断层成像领域。
英文摘要
We demonstrate tomographic phase imaging of cubic gold nanoparticles with sub-100 nm resolution requiring just a single far-field coherent diffraction pattern per projection. By using randomized probe imaging (RPI), a real-space amplitude and phase image can be reconstructed from a single diffraction pattern. These phase images are then fed into a standard tomographic workflow to retrieve the 3D volume. Nanoscale X-ray phase tomography has often relied on ptychography, which requires slow 2D scanning for each projection. By using RPI, the data collection is greatly sped up at the cost of some resolution. We compare an RPI-tomography volume to a ptychography-tomography volume of the same sample, finding high consistency between the two methods. To the best of our knowledge, this is the first application of RPI to tomography.
