通过法布里-珀罗干涉探测扭曲双层石墨烯的电势分布
Probing the Potential Profile of Twisted Bilayer Graphene via Fabry-Pérot Interference
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中文总结 AI 辅助
本研究利用法布里-珀罗干涉探测大角度扭曲双层石墨烯的电势分布，通过分析干涉图样和磁输运测量确定了器件中局域掺杂形成的隐藏腔特征，证明干涉光谱学可作为探测弹道器件局域缺陷的简便方法。
中文摘要 AI 辅助
我们利用法布里-珀罗干涉探测大角度扭曲双层石墨烯的内部电势分布。我们将名义上单极 regime 中的反常电阻振荡追溯至器件中无意局域掺杂形成的隐藏腔。通过分析零场干涉图样，我们确定了该非均匀性的位置和尺寸。磁输运测量支持该模型，通过不同的磁依赖性区分了局域腔模式与全局共振。利用提取的电势分布进行的模拟重现了实验特征。我们的结果表明，干涉光谱学是一种简单、非侵入式的探测方法，可用于识别弹道器件中的局域缺陷和内部势垒。
英文摘要
We use Fabry-Pérot interference to probe the internal potential profile of large-angle twisted bilayer graphene. We trace anomalous resistance oscillations in the nominally unipolar regime to a hidden cavity formed by unintentional local doping in our device. By analyzing zero-field interference patterns, we determine the location and size of this inhomogeneity. Magnetotransport measurements support the model, distinguishing local cavity modes from global resonances through their different magnetic dependence. Simulations using our extracted profile reproduce the experimental features. Our results highlight interference spectroscopy as a simple, non-invasive probe for identifying local defects and internal potential barriers in ballistic devices.
