AI 中文总结
本研究利用整数磁通量子比特，无需辅助量子比特实现硬件高效的擦除错误检测，通过丢弃擦除事件大幅提升量子态寿命与门性能，为量子纠错提供了新平台。
AI 中文摘要
擦除错误检测可通过揭示错误事件的时间和位置，提升量子纠错的效率。本研究在单个整数磁通量子比特（integer fluxonium）中实现了擦除转换与 mid-circuit 擦除检测，其中态 |g⟩、|f⟩ 编码逻辑态，|e⟩ 编码擦除态。整数磁通量子比特可抑制直接的 |f⟩→|g⟩ 跃迁，使占主导的 |f⟩→|e⟩ 跃迁转换为可检测的擦除事件；此外，研究确定了一个设计空间，可抵消两个逻辑态之间的共振频率偏移，无需辅助量子比特，仅用最终读出所用的同一谐振器即可实现 mid-circuit 擦除检测。通过丢弃检测到的擦除事件，研究实现 |f⟩ 态寿命提升8.4倍，Hahn回波时间提升1.38倍，单量子比特门误差从0.061(2)%降至0.030(5)%。研究结果确立整数磁通量子比特为硬件高效的擦除错误检测与转换平台，同时明确了实现高擦除偏置的有效擦除量子比特所需的改进。
英文摘要
Erasure-error detection can improve the efficiency of quantum error correction by revealing the times and locations of their error events. In this work, we demonstrate erasure conversions and mid-circuit erasure detections in a single integer fluxonium, in which the states $\mathrm{|g\rangle, |f\rangle}$ encode the logical states and $\mathrm{|e\rangle}$ encodes the erasure state. The integer fluxonium suppresses direct $|\mathrm{f} \rangle \rightarrow |\mathrm{g} \rangle$ transitions and allows the dominant $|\mathrm{f} \rangle \rightarrow |\mathrm{e}\rangle$ transitions to be converted into detectable erasures. Furthermore, we identified a design space that nullifies the resonant-frequency shift between the two logical states, enabling ancilla-free mid-circuit erasure checks using the same resonator employed for final readout. By discarding the detected erasure events, we achieved an 8.4-fold increase in the $|\mathrm{f}\rangle$ state lifetime, a 1.38-fold increase in the Hahn-echo time, and a reduction of single-qubit gate error from 0.061(2)% to 0.030(5)%. Our results establish integer fluxonium as a hardware-efficient platform for erasure-error detection and conversion, while identifying the improvements required to realize an effective erasure qubit with high erasure bias.
