AI 中文总结
本研究开发了一种用于卷对卷沉积环境的光学成像表征装置，可同时测定0.3至110微米范围内多层透明/半透明材料的厚度及双折射，为有机太阳能电池相关材料的生产检测提供支持。
AI 中文摘要
光学技术为材料检测提供了快速灵活的途径，尤其在材料生产过程中对关键参数进行监测，有助于获取最优参数以实现预期材料功能并确保产品质量。本文介绍一种专为卷对卷沉积环境下快速材料检测设计的光学成像装置，该方法可稳健地同时测定0.3至110微米范围内多层透明或半透明材料的厚度，材料形式可为自由薄膜或沉积在较厚透明衬底上的薄膜。本概念验证中选用的PEDOT和ZnO材料与有机太阳能电池的制备相关，此外该方法还可用于表征双折射。
英文摘要
Optical techniques provide a fast and flexible path to material inspection. In particular, the investigation of key metrics during material production can help obtain the optimal parameters to achieve desired material functionality as well as to ensure product quality. Here we present an optical imaging setup designed for fast material inspection in a roll-to-roll deposition environment. The method allows for robust simultaneous determination of thickness in the range from 0.3 to 110 micrometers of multiple layers of transparent or semi-transparent materials in the form of a free film or a film deposited on a thicker transparent substrate. The PEDOT and ZnO materials chosen for this proof of concept are relevant for the fabrication of organic solar cells. Additionally, the method may be used to characterize birefringence.
