AI 中文总结
研究针对胶体半导体量子点发光闪烁问题，提出基于复合率方差和相对量子产率的无阈值二维定量准则，通过模拟验证可清晰区分闪烁机制并量化抑制程度，为比较闪烁抑制策略提供可靠指标。
AI 中文摘要
胶体半导体量子点因其可调谐发射和高量子产率而在众多应用中颇具前景。然而，发光闪烁形式的发射不稳定性仍是其实际应用的重大障碍。虽合成和表面工程的进展已实现部分或完全抑制闪烁，但对这种抑制“质量”的定量评估仍具挑战性。现有准则通常基于阈值将其分为开和关状态，因单量子点发射强度的连续分布而含混不清。我们提出基于复合率方差和相对量子产率的无阈值二维定量准则，二者可从标准时间相关单光子计数测量中提取。通过模拟涵盖所有主要闪烁机制的闪烁轨迹验证该准则，它能将其清晰地分为二维参数空间的不同区域，同时提供抑制程度的定量度量。此方法直接量化发射的时间稳定性，无需任意状态定义，为比较不同闪烁抑制策略提供了可靠指标。
英文摘要
Colloidal semiconductor quantum dots are promising materials for numerous applications due to their tunable emission and high quantum yields. However, emission instability in the form of luminescence blinking remains a significant obstacle to their practical implementation. While recent advances in synthesis and surface engineering have demonstrated partial or complete blinking suppression, the quantitative assessment of the "quality" of this suppression remains challenging. Existing criteria typically rely on threshold-based classification into ON and OFF states, which becomes inherently ambiguous owing to the continuous distribution of emission intensities in single quantum dots. Here, we propose a threshold-free two-dimensional quantitative criterion based on the variance of the recombination rate and the relative quantum yield, both of which can be extracted from standard time-correlated single-photon counting measurements. We validate the criterion using simulated blinking trajectories covering all major blinking mechanisms and demonstrate that it cleanly separates them into distinct regions of the two-dimensional parameter space while providing a quantitative measure of the degree of suppression. This approach directly quantifies the temporal stability of emission without requiring arbitrary state definitions, thereby providing a robust metric for comparing different blinking suppression strategies.
Comments22 pages, 5 figures. Supplementary: 13 pages, 1 figure
