AI 中文总结
研究旨在利用未来 30 米级望远镜的极端自适应光学技术进行宜居系外行星成像。针对当前系统与目标对比度的差距，提出 fastrSHWFS 设计减少时间延迟，介绍了其原理、掩模制作技术及测试结果，改进了之前光学质量不足的问题。
AI 中文摘要
近期的《2020 年天文学和天体物理学十年调查》将利用未来 30 米级望远镜上的极端自适应光学技术进行宜居系外行星成像列为未来十年的关键优先事项。然而，目前最佳系统与实现该目标所需的对比度之间存在 100 倍的差距。天文自适应光学是在未来极大望远镜上实现地基衍射极限系外行星成像的必要方法。曝光结束与可变形镜指令应用之间的时间延迟是许多自适应光学系统误差预算的主要因素，探测器读取时间通常是该延迟的重要组成部分。我们提出了两种改进的 Shack Hartmann 波前传感器（SHWFS）设计，即快速 Shack Hartmann 波前传感器（fastrSHWFS），以减少时间延迟。该设计将焦平面上的光斑图案引导成具有自定义纵横比的矩形或线性阵列，减少读出时间。这些掩模由最近可用的灰度双光子聚合 3D 打印技术制成，原则上为这种掩模提供了足够的深度分辨率和动态范围。带聚焦的掩模产生像差结果，而仅带倾斜/俯仰的掩模产生一些确定的光斑。本文概述了当前的 SHWFS 概念、我们解决时间延迟的 fastrSHWFS 理论方案、印刷掩模设计的反射和质量分析，以及在劳伦斯利弗莫尔国家实验室的高对比度试验台上对两种掩模进行测试的结果。这项工作是在之前制造的光学质量不足的 fastrSHWFS 掩模测试之后进行的。
英文摘要
The recent 2020 Decadal Survey of Astronomy and Astrophysics listed habitable exoplanet imaging with future extreme adaptive optics (AO) on 30m-class telescopes as a key priority in the coming decade. However, there is a current 100x contrast gap between the best systems today and what is needed to enable this goal. Astronomical AO is a required approach to enable ground-based diffraction-limited imaging of exoplanets on future extremely large telescopes. Time lag between the end of an exposure and the application of deformable mirror commands is a major contributor to the error budget in many AO systems, and detector read time is often a large component of this lag. We present two designs for a modified Shack Hartmann wavefront sensor (SHWFS), named Focal plane Actualized Shifted Technique Realized for a SHWFS (fastrSHWFS), to reduce the time lag component. This design steers the spot pattern at the focal plane into a rectangular or linear array with a custom aspect ratio, reducing readout time. These masks were made by a recently available gray-scale two photon polymerization 3D printing technology that in principle provides sufficient depth resolution and dynamic range for such masks. The mask with focus yields aberrated results while the mask with tip/tilt only yields some defined spots. This manuscript outlines the current SHWFS concept, our fastrSHWFS theoretical solution to addressing time lag, reflection and quality analysis of printed mask designs, and results from testing both masks on the High Contrast Testbed at Lawrence Livermore National Lab. This work follows the test of a previous fabricated fastrSHWFS masks that had insufficient optical quality.
CommentsFurther author information: (Send correspondence to Benjamin L. Gerard) Benjamin L. Gerard.: E-mail: gerard3@llnl.gov
