AI 中文总结
研究固态自旋缺陷中机械驱动与量子读出分离问题，提出片上可编程机械量子换能器，集成微机械驱动与自旋频率读出，能检测低应变，提供高体积力密度，通过框架实现电控制微机械输入到自旋频率响应的直接测量。
AI 中文摘要
固态自旋缺陷将局部扰动编码为自旋跃迁频率的可测量变化，但机械驱动和量子读出在物理上是分离的，导致测量设置离散。集成这些功能需要一个现场机械量子接口，对缺陷主体的晶格状态进行编程并将其定量映射到自旋哈密顿量上。本文首次报道了一种片上可编程机械量子换能器（OCPMQT），它在二维范德华量子缺陷主体中集成了电压定义的微机械驱动和原位自旋频率读出。机械编程的晶格状态被编码为轴向零场分裂参数的变化，并通过光探测磁共振（ODMR）光谱法解析。在2.05×10⁻² cm³的芯片体积内，该换能器可检测低至0.0080%的ODMR推断应变，并提供约2.6×10⁴ N/m³的体积力密度。一个微机械到自旋哈密顿量框架将片上机电、界面应变传递和应变-自旋耦合联系起来，使电控制微机械输入能够直接作为自旋频率响应进行测量。
英文摘要
Solid-state spin defects encode local perturbations as measurable shifts in spin-transition frequencies, but mechanical actuation and quantum readout remain physically separated, resulting in a discrete measurement setup. Integrating these functions requires an on-site mechano-quantum interface that programs the lattice state of a defect host and quantitatively maps it onto the spin Hamiltonian. Here we first report an on-chip programmable mechano-quantum transducer (OCPMQT) that integrates voltage-defined micromechanical actuation with in situ spin-frequency readout in a two-dimensional van der Waals quantum-defect host. Mechanically programmed lattice states are encoded as shifts in the axial zero-field splitting parameter and resolved by optically detected magnetic resonance (ODMR) spectroscopy. Within a chip volume of 2.05*10^-2 cm^3, the transducer accesses ODMR-inferred strains as low as 0.0080% and delivers a volumetric force density of approximately 2.6*10^4 N*m^-3. A micromechanical-to-spin-Hamiltonian framework links on-chip electromechanics, interfacial strain transfer, and strain-spin coupling, enabling the electrical control micromechanical input to be measured directly as spin-frequency response.
