AI 中文总结
研究针对天文应用中Skipper CCD读出时间长的问题，提出从第一原理推导的通用优化方案，基于传感器固有噪声功率谱密度建模权衡，可预测最佳工作点，指出最小化每次采样电荷转移时间是实现快速读出的关键。
AI 中文摘要
Skipper CCD通过多次无损测量单个像素电荷包来降低读出噪声，这在天文界引起了广泛关注，尤其是在针对高红移微弱天体的光谱巡天中。然而，重复采样降噪会不可避免地增加读出时间。为确定其在天文应用中的最佳运行模式，平衡噪声改善和读出时间，传统上是针对每个CCD架构进行经验性优化。本文提出了一种从第一原理推导的通用优化方案，并在实验室中使用Oscura实验所用的Skipper CCD进行了实验验证。此前已通过经验观察到存在相关双采样积分时间和Skipper采样次数的最佳组合，以在最短读出时间达到给定读出噪声水平，本文基于传感器的固有噪声功率谱密度对这种权衡进行了分析建模，能够预测而非针对每个架构通过实验确定最佳工作点。还进一步表明，最佳位置由每次采样的电荷转移时间决定，因此最小化该时间是实现快速Skipper CCD读出的关键。
英文摘要
Skipper CCDs enable the reduction of CCD readout noise by non-destructively measuring the individual pixel charge packets multiple times. This readout noise reduction has attracted considerable interest in the astronomical community, particularly in spectroscopic surveys targeting faint objects at high redshifts. However, noise reduction via repetitive sampling leads to an unavoidable increase in readout time, often to prohibitive levels. To enable their use in astronomical applications, the optimal operation regime of Skipper CCDs must be determined, balancing noise improvement and readout time. Traditionally, such optimization has been carried out empirically for each CCD architecture. We present a general optimization scheme derived from first principles and experimentally verified in the laboratory using a Skipper CCD as used by the Oscura experiment. While the existence of an optimal combination of correlated double-sampling integration time and number of Skipper samples for reaching a given readout noise level at minimal readout time has previously been observed empirically, we model this trade-off analytically based on the intrinsic noise power spectral density of the sensor, allowing the optimal operating point to be predicted rather than determined experimentally for each architecture. We further show that the location of this optimum is governed by the per-sample charge-transfer time, whose minimization is therefore key to achieving fast Skipper CCD readout.
CommentsSubmitted as proceedings to SPIE Astronomical Telescopes + Instrumentation
Journal refProc. SPIE 14157, X-Ray, Optical, and Infrared Detectors for Astronomy XII, 141572K (19 Aug 2026)
