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受静电荷影响的ATLAS18 ITk条形传感器的伽马辐照

Gamma irradiation of ATLAS18 ITk strip sensors affected by static charge

M. Mikestikova, V. Fadeyev, P. Federicova, J. Fernandez-Tejero, C. Fleta, P. Gallus, C. Jessiman, J. Keller, C. Klein, T. Koffas, J. Kroll, J. Kvasnicka, E. Staats, P. Tuma, M. Ullan, Y. Unno

arXiv 2607.19936首次发表:更新:

AI 中文总结

研究ATLAS18 ITk条形传感器受静电荷影响的问题,通过用60Co源伽马射线对受电荷影响的传感器进行不同TID值辐照,发现少量累积TID可消除静电荷负面影响,为实际实验中减轻静电荷问题提供信心。

AI 中文摘要

由ATLAS合作组织开发的新型全硅ITk用于追踪HL-LHC产生的带电粒子,2021年开始建造,预计2028年完成。ITk探测器将包含约18,000个高度分段且抗辐射的n+-in-p硅条形传感器,由HPK制造。交付后,合作团队进行详细测量以监测质量。多数传感器在QC测试中表现出色,但一些批次的传感器电气测试失败。数据表明电气测试失败与传感器表面初始接收测试时的高静电荷有关。本研究调查了实际实验中预期的TID能否有效解决静电荷导致的早期击穿或低条间隔离问题。选择受电荷影响的传感器用60Co源的伽马射线进行不同TID值的辐照。结果表明,在极少量累积TID后,静电荷对关键传感器特性的负面影响消失,这一发现让我们对在实际实验中减轻ITk条形传感器运行时的静电荷问题充满信心。

英文摘要

Construction of the new all-silicon ITk, developed by the ATLAS collaboration to be able to track charged particles produced at the HL- LHC, started in 2021 and is expected to continue until 2028. The ITk detector will include ~18,000 highly segmented and radiation hard n+-in-p silicon strip sensors, which are being manufactured by HPK. Upon their delivery, the ATLAS ITk strip sensor collaboration performs detailed measurements of sensors to monitor quality of all fabricated pieces. QC electrical tests include IV and CV tests, full strip tests, and a measurement of the long-term stability of the sensor leakage current. While most sensors demonstrate excellent performance during QC testing, we have nevertheless observed that a number of sensors from several production batches failed the electrical tests. Accumulated data indicates a strong correlation between observed electrical test failures and high electrostatic charge measured on the sensor surface during initial reception tests. This electrostatic charge enhances the risk of "Local trapped charge" events during manufacturing, shipping, and handling procedures, resulting in failed electrical QC tests. In the presented study, we have investigated whether the TID expected in the real experiment can effectively resolve early breakdown or low interstrip isolation caused by the electrostatic charge. Selected charge-affected sensors were irradiated with gamma rays from a 60Co source for a number of TID values. The results of this study indicate that the negative effects of the electrostatic charge on the critical sensors characteristics disappear after a very small amount of an accumulated TID, which actually corresponds to one or two days in the experiment. This finding gives us confidence in mitigating the issue of electrostatic charge during the operation of the ITk strip sensors in the real experiment.

CommentsVertex2023

Journal refProceedings of Science, PoS(VERTEX2023)026 https://pos.sissa.it/448/026/pdf

DOI:10.22323/1.448.0026

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