AI 中文总结
针对柔性电子中混合信号电路测试难题，提出基于分布式延迟的BIST框架，采用特殊两用振荡器，面积和功耗大幅降低，嵌入轻量级数字BIST实现缺陷监测，提高了缺陷覆盖率且功耗开销低。
AI 中文摘要
基于铟镓锌氧化物薄膜晶体管（IGZO-TFT）的柔性电子器件正用于超低功耗可穿戴应用。但缺乏封装、引脚有限和器件高变异性使传统自动测试设备不适用于测试柔性电子中的模拟/混合信号电路。本文提出一种兼具功能定时模块和基于分布式延迟的内建自测试（BIST）框架核心结构的两用环形振荡器（RO）和压控振荡器（VCO）。该振荡器比之前的IGZO-TFT设计面积减小1100倍、功耗降低5600倍。每个RO阶段嵌入的轻量级数字BIST可进行逐阶段延迟监测以检测缺陷。BIST对单个缺陷的缺陷覆盖率达93%，对多个同时出现的缺陷为88%，功耗开销仅3%。
英文摘要
Flexible electronics (FE) based on indium gallium zinc oxide thin-film transistors (IGZO-TFTs) are emerging for ultra-low-power wearable applications. However, lack of packaging, limited pins, and high device variability make conventional Automatic Test Equipment (ATE) impractical for testing analog/mixed-signal circuits in FE. This work presents a dual-purpose ring oscillator (RO) and voltage-controlled oscillator (VCO) serving as functional timing blocks and core structures for a distributed delay-based BIST framework. The oscillators achieve 1100x area reduction and 5600x lower power than previous IGZO-TFT designs. Lightweight digital BIST embedded within each RO stage enables stage-wise delay monitoring for defect detection. The BIST achieves 93% defect coverage for individual defects and 88% for multiple simultaneous defects, with only 3% power overhead
CommentsAccepeted for publication at 2026 IEEE European Test Symposium (ETS)
DOI：10.1109/ETS69887.2026.11591727
