AI 中文总结
研究高能量下全场透射X射线显微镜（TXM）性能受限问题，利用自由形式金刚石折射光学，通过定制光束整形器、移动漫射器和校正透镜等组成光学系统，实现20keV下72nm分辨率成像，拓展了纳米成像应用并开辟新设计途径。
AI 中文摘要
全场透射X射线显微镜（TXM）能够对厚且强吸收材料进行无损三维高空间分辨率成像，在生物、能量转换和存储等领域有广泛应用。然而，在高光子能量下，TXM性能受衍射光学效率降低和照明与物镜光学数值孔径匹配挑战的限制。本文利用自由形式金刚石折射光学克服高能TXM中关键的照明效率瓶颈，展示了在20keV下具有72nm半周期分辨率的全场纳米成像。光学系统包括定制设计的金刚石折射光束整形器、靠近样品的移动漫射器和高精度像差校正金刚石复合折射透镜作为物镜光学元件。这些结果确立了自由形式金刚石光学作为高效高能TXM的有力途径，拓展了全场纳米成像到复杂、动态材料系统，并能在实际实验条件下进行原位、实时和断层扫描研究。此外，还为新一代高能X射线纳米成像的联合X射线光学 - 数字设计创新开辟了新途径。
英文摘要
Full-field transmission X-ray microscopy (TXM) enables nondestructive three-dimensional imaging of thick and strongly absorbing materials with high spatial resolution. Such capabilities are essential for understanding structure-function relationships in hierarchical materials, with broad applications in biology, energy conversion, and energy storage. At high photon energies, however, TXM performance is limited by the reduced efficiency of diffractive optics and by the challenge of matching the numerical aperture (NA) of the illumination to that of the objective optics. Here we harness freeform diamond refractive optics to overcome a key illumination-efficiency bottleneck in high-energy TXM, demonstrating full-field nano-imaging at 20 keV with a half-period resolution of 72 nm. The optical system combines a custom-designed diamond refractive beam shaper that produces a uniform near-flat-top illumination at the sample with a 94% efficiency, a moving diffuser placed near the sample to increase the effective illumination NA and improve image quality and resolution, and high-precision aberration-corrected diamond compound refractive lenses as the objective optics. These results establish free-form diamond optics as a powerful route to efficient high-energy TXM, expanding full-field nano-imaging to complex, evolving materials systems and enabling in situ, operando, and tomographic studies under experimentally realistic conditions. Furthermore, it opens new avenues for innovation of joint X-ray optical-digital design for a new generation of high-energy X-ray nano-imaging.
