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在单个硅光子芯片上产生和检测压缩光

Generation and detection of squeezed light on a single silicon photonic chip

Oliver M. Green, Bethany Puzio, Rowan A. Hoggarth, Rachel N. Clark, Edward C. R. Deacon, Alex S. Clark, Jonathan C. F. Matthews, Giacomo Ferranti

arXiv 2607.15461首次发表:更新:

AI 中文总结

研究在单个硅光子芯片上产生和检测压缩光,利用硅波导中自发四波混频产生压缩光,经同一芯片上光电二极管检测,直接测量出0.25(1)dB压缩,分析了非线性损耗影响,推动量子光子学发展。

AI 中文摘要

在单个集成光子器件上产生和检测光的量子态的能力对于将量子光子学扩展到有用的量子技术至关重要。将所需功能集成到互补金属氧化物半导体兼容的单片芯片中,可以降低成本并通过小型化解锁新功能。在这项工作中,我们展示了一种用于在完全在室温下运行的市售平台上单片产生和检测量子光的单绝缘体上硅光子集成电路。具体来说,我们利用硅波导中的自发四波混频来产生压缩光,随后由与光源在同一芯片上以脉冲零差探测器配置运行的光电二极管进行检测。我们直接测量了0.25(1)dB的压缩,包括来自波导传播损耗和检测效率低下的贡献,并详细分析了非线性损耗对使用该平台可实现的压缩水平的影响。

英文摘要

The ability to generate and detect quantum states of light on a single integrated photonic device is essential to scale quantum photonics into useful quantum technologies. Integrating the required capabilities into complementary-metal-oxide-semiconductor compatible monolithic chips can reduce cost and unlock new functionality through miniaturisation. In this work we demonstrate a single silicon-on-insulator photonic integrated circuit for the monolithic generation and detection of quantum light on a commercially available platform that operates entirely at room temperature. Specifically, we leverage spontaneous four-wave mixing in silicon waveguides to produce squeezed light which is subsequently detected by photodiodes operating in a pulsed homodyne detector configuration on the same chip as the source. We directly measure $0.25(1)$ dB of squeezing, including contributions from waveguide propagation loss and detection inefficiency, and include a detailed analysis of the impact of nonlinear loss on the squeezing levels achievable using this platform.

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