用于中子β衰变电子能谱的厚像素化硅探测器的表征
Characterisation of a Thick Pixelated Silicon Detector for Electron Spectroscopy of Neutron Beta Decay
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中文总结 AI 辅助
利用FRM II的PERC仪器，旨在通过测量极化和非极化中子的β能谱确定相关常数和元素并寻找其他贡献。为此展示了商用像素化探测器的表征，以评估其测量自由中子β衰变整个电子能谱的适用性。
中文摘要 AI 辅助
硅探测器常用于低能粒子能谱分析。对于1MeV能量范围的电子，需要2mm的较大厚度才能完全阻止电子，而商业选择稀少。利用FRM II的PERC仪器，旨在测量极化和非极化中子的β能谱，以确定轴矢量耦合常数、卡比博-小林-益川夸克混合矩阵的元素$V_\textrm{ud}$，并寻找假设的标量和张量贡献。我们展示了一种商用像素化探测器的表征，以评估其测量自由中子β衰变整个电子能谱的适用性。
英文摘要
Silicon detectors are commonly used for spectroscopy of low-energy particles. For electrons in the 1 MeV range, a rather large thickness of 2mm is required to entirely stop the electrons and commercial options are scarce. With the instrument PERC at the FRM II, we aim to measure beta spectra from polarised and unpolarised neutrons in order to determine the axial-vector coupling constant, the element $V_\textrm{ud}$ of the Cabibbo-Kobayashi-Maskawa quark-mixing matrix, and to search for hypothetical scalar and tensor contributions. We present the characterisation of a commercially available, pixelated detector to assess its suitability to measure the entire electron energy spectrum of free neutron beta decay.
